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作 者:舒敏 梁俊辉 陈达[1] 陈招 秦来顺[1] SHU Min;LIANG Junhui;CHEN Da;CHEN Zhao;QIN Laishun(College of Materials and Chemistry,China Jiliang University,Hangzhou 300018,China;Wenzhou Zhaoflon Co.,Ltd.,Wenzhou 325016,China)
机构地区:[1]中国计量大学材料与化学学院,杭州300018 [2]温州赵氟隆有限公司,温州325016
出 处:《人工晶体学报》2024年第6期1061-1068,共8页Journal of Synthetic Crystals
基 金:国家自然科学基金(62304214,62304213,51972294);浙江省省属高校基本科研业务费(2021YW35,2021YW36)。
摘 要:表面增强拉曼散射(SERS)技术可以快速检测微量分子,在医药材料分析、有害物残留、食品安全等领域受到广泛关注。而SERS对被检测物质的响应极限则取决于基底性能,并直接影响最终检测效果。本文着眼于增加基底的比表面积及其与被检测物之间的光诱导电荷转移能力,通过简单的水热合成法成功制备出具有氧空位缺陷的MoO_(3-x)纳米槽。结合X射线光电子能谱(XPS)、紫外-可见光谱(UV-Vis)、傅里叶变换红外光谱(FT-IR)等手段,对MoO_(3-x)纳米槽的电子结构、光学性质和表面化学环境进行了分析。使用MoO_(3-x)纳米槽作为SERS基底,对罗丹明6G(R6G)、结晶紫(CV)和玫瑰红B(RhB)三种有机染料分子进行了检测,实验结果显示,其对R6G的检测极限可以达到10^(-10)mol/L,与同类型的半导体基底相比,它具有更好的拉曼增强活性。Surface-enhanced Raman scattering(SERS)technology,which enables the rapid detection of trace molecules,has gained widespread attention in areas such as pharmaceutical material analysis,identification of hazardous substance residues,and food safety.The response limit of SERS to the detected substances depends on the performance of the substrate and directly affects the final detection effect.In this paper,MoO_(3-x) nanoslots with oxygen vacancy defects were successfully prepared by a simple hydrothermal method with the aim of increasing the specific surface area of the substrate and its ability of photoinduced charge transfer between the substrate and the detected substances.The electronic structure,optical properties and surface chemical environment of the MoO_(3-x) nanoslots were analyzed by a combination of X-ray photoelectron spectroscopy(XPS),ultraviolet-visible spectroscopy(UV-Vis)and Fourier transform infrared spectroscopy(FT-IR).Three organic dye molecules,rhodamine 6G(R6G),crystalline violet(CV)and rose red B(RhB),were detected using the MoO_(3-x) nanoslots as SERS substrates,and the experimental results show that the detection limit of R6G could reach 10^(-10 )mol/L,and it has better Raman-enhancing activity compared with the same type of semiconductor substrates.
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