基于高加速寿命试验的MLCC寿命建模研究  

Research on the Life Modeling of MLCC Based on Highly Accelerated Life Test

作　　者：黄俊钦 曹秀华 刘建梅 吴福根[1] 杨少华[3,4] HUANG Junqin;CAO Xiuhua;LIU Jianmei;WU Fugen;YANG Shaohua(School of Physics and Optoelectronics Engineering,Guangdong University of Technology,Guangzhou 510006,China;State Key Laboratory of Key Materials and Processes for New Electronic Components,Guangdong Fenghua High-Tech Co.,Ltd.,Zhaoqing 526020,China;CEPREI,Guangzhou 511370,China;Science and Technology on Reliability Physics and Application of Electronic Component Laboratory,Guangzhou 511370,China)

机构地区：[1]广东工业大学物理与光电工程学院,广东广州510006 [2]广东风华高新科技股份有限公司新型电子元器件关键材料与工艺国家重点实验室,广东肇庆526020 [3]工业和信息化部电子第五研究所,广东广州511370 [4]电子元器件可靠性物理及其应用技术国家级重点实验室,广东广州511370

出　　处：《电子产品可靠性与环境试验》2024年第3期55-59,共5页Electronic Product Reliability and Environmental Testing

摘　　要：为了解决多层片式陶瓷电容器(MLCC)在高可靠产品应用、研发验证和产品改进等环节对快速可靠性评价技术的需求,提出了一种基于Procopowicz-Vaskas模型(P-V模型)的高加速寿命试验(HALT)评价方法,开展了某10μF 6.3 V MLCC产品在9组不同高温、高电压下的HALT研究。获得了样品在不同温度和电压应力下的失效分布特征,其P-V寿命模型参数的激活能为1.30 eV、电场加速因子为3.79。建立了高容量MLCC产品的HALT寿命模型,为其可靠性快速评价提供了参考。In order to satisfy the need for rapid reliability evaluation technology for MLCC in high reliability product applications,R&D verification,and product improvement,a HALT evaluation method based on P-V model is proposed,and the HALT of a 10μF/6.3 V/0805 MLCC product under 9 groups of different high temperature and high voltage is carried out.The failure distribution characteristics of the sample under different temperature and voltage stresses are obtained.The activation energy of P-V lifetime model parameters is 1.30 eV and the electric field acceleration factor is 3.79.A HALT life model for high-capacity MLCC products is developed,which can provide a reference for rapid evaluation of their reliability.

关 键 词：多层片式陶瓷电容器 高加速应力 寿命试验 寿命模型 

分 类 号：TM53[电气工程—电器]