反射式太赫兹连续波线扫描成像系统  

Reflective terahertz continuous wave linear array scanning imaging system

作　　者：王一晨 王新柯[1] 张岩[1] WANG Yichen;WANG Xinke;ZHANG Yan(Beijing Key Laboratory of Metamaterials and Devices,Department of Physics,Capital Normal University,Beijing 100048)

机构地区：[1]首都师范大学物理系、超材料与器件北京市重点实验室,北京100048

出　　处：《首都师范大学学报（自然科学版）》2024年第2期36-42,共7页Journal of Capital Normal University：Natural Science Edition

基　　金：国家自然科学基金面上项目(62275175)。

摘　　要：利用太赫兹线阵探测器和0.3 THz辐射源,搭建了反射式太赫兹连续波线扫描成像系统。通过双次扫描测量和图像线性叠加可以对样品反射的太赫兹图像进行精准测量,成像分辨率达到2 mm,成像面积达到40 mm×40 mm,测量耗时<3.0 min。利用此系统对隐蔽在信封和纺织物中的金属样品进行了成功识别,对预埋在聚乙烯板和泡沫塑料板内的异物进行了精准定位。实验结果验证,此系统可以对隐蔽在电介质材料中的物体进行快速准确地检测,表明了其在安全检查和无损探伤领域的应用价值。Utilizing a terahertz(THz)linear array detector and a 0.3 THz radiation source,a reflective THz continuous wave linear array scanning imaging system was built.Using the imaging system,THz images reflected by samples could be accurately measured with double scan measurements and an image linear superposition.The imaging resolution and the measurement region could approach 2 mm and 40 mm×40 mm with 3.0 min of the time consumption.Taking advantage of this system,the metallic samples hidden by envelopes and textiles were successively identified.In addition,the foreign matters embedded in polyethylene and plastic foam plates were exactly discerned.The experimental results demonstrated that objects concealed by dielectric materials can be quickly and precisely inspected by the imaging system,which indicated its application values in security inspection and nondestructive testing.

关 键 词：太赫兹成像 反射式 线扫描 

分 类 号：O439[机械工程—光学工程] TN29[理学—光学]