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作 者:张振伟[1] 张存林[1] ZHANG Zhenwei;ZHANG Cunlin(Department of Physics,Capital Normal University,Beijing 100048)
出 处:《首都师范大学学报(自然科学版)》2024年第2期43-54,共12页Journal of Capital Normal University:Natural Science Edition
基 金:中关村概念验证项目(20210421079);装备预研航天科技联合基金项目(6141B06100601);国家自然科学基金委航天制造联合基金项目(U1837202)。
摘 要:本文完善了基于太赫兹时域光谱系统和基于矢量网络分析系统材料参数测量的一般理论,在2类系统的交叉频段,建立了相同准光学参数的测量条件,对比分析了2类系统信号参数测量和理论提取的过程。实验验证了在光子学和电子学的重叠区域,不同测量系统在相同测量条件下,能够获取趋于一致的测量结果,证实了结果的准确性只取决于物理模型、理论方法和测量条件是否匹配。提炼出采用单次时域法同时适用于时域系统和频域系统参数测量和提取的适配条件,并形成匹配条件经验理论公式,用于判断材料太赫兹参数测量结果的可靠性。This work perfects the general theory of material parameter measurement based on terahertz time-domain spectroscopy system and vector network analysis system.In the cross frequency band of the two systems,measurement conditions for the same quasi-optical parameters are established,and the process of signal parameter measurement and theoretical extraction for the two systems is compared and analyzed.The experimental results verified that in the overlapping area of photonics and electronics,different measurement systems can obtain consistent measurement results under the same measurement conditions.The accuracy of the results only depends on compatibility of physical model,theoretical method,and measurement conditions.The single time domain method has been extended to both time-domain and frequency-domain systems,and formed an empirical theoretical formula for the matching conditions,which can be used to determine the reliability of material terahertz parameter measurement results.
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