引伸计标定器的校准方法  

Re-study on calibration technology of extensometer calibrator

作　　者：王林 彭婷婷 孟德光 李维军 Wang Lin;Peng Tingting;Meng Deguang;Li Weijun(Shandong Institute of Metrology)

机构地区：[1]山东省计量科学研究院

出　　处：《上海计量测试》2024年第3期19-21,共3页Shanghai Measurement and Testing

摘　　要：提出利用高精度光栅测微计代替三等、四等量块和三珠工作台检定B类引伸计标定器的校准方法,同时研究校准结果并实施了准确的测量不确定度评定,论证了高精度光栅测微计校准引伸计标定器的可行性和直观易操作性。This paper presents a calibration method for calibrating class B extensometer calibrator by using high-precision grating micrometer instead of the third-and fourth-magnitude blocks and the three-bead worktable,and evaluates the uncertainty of calibration results,the feasibility and easy operation of calibrating extensometer calibrator with high precision grating micrometer are demonstrated.

关 键 词：高精度光栅测微计 B类引伸计标定器 校准 测量不确定度 

分 类 号：TH707[机械工程—仪器科学与技术]