波长快速扫描系统的关键技术研究  

Research on Key Technology of High Speed Swept Testing System

作　　者：乔山 韩纪磊 张世杰 盛立文 徐超 石佳慧 QIAO Shan;HAN Jilei;ZHANG Shijie;SHENG Liwen;XU Chao;SHI Jiahui(Ceyear Technologies Co.,Ltd.,Qingdao,China;Shangdong Electronic Test&Measurement Technology Innovation Center,Qingdao,China;Science and Technology on Electronic Test&Measurement Laboratory,Qingdao,China)

机构地区：[1]中电科思仪科技股份有限公司,山东青岛 [2]山东省电子测量仪器技术创新中心,山东青岛 [3]电子测试技术重点实验室,山东青岛

出　　处：《光电技术应用》2024年第3期56-61,共6页Electro-Optic Technology Application

摘　　要：波长快速扫描系统在算力网络、5G前传网络以及新一代可重构光分插复用系统等领域起着重要作用,整个波长扫描测试系统的性能基本取决于激光器性能的优劣。为此,基于In Ga As P/In P增益芯片优异的宽光谱光学特性和Littman-Metcalf外腔反馈原理研制了一台具备宽调谐范围、高扫描速度以及无模式跳变等特点的可调谐激光器。实验上获得了240 nm/s的最高扫描速度、0.001 nm的最小步进触发间隔、优于±1.3 pm/1 min的波长稳定性、优于2.39 pm的绝对波长精度、优于±0.02 d B/1 min的功率稳定性及无跳模范围为110 nm的单纵模扫频输出。该研究有助于推动波长快速扫描测试系统的研究进程,提升波分复用等器件的测试精度和效率。High speed swept testing system plays an important role in the fields of computing first network,5G front haul network,and a new generation of reconfigure-able optical division multiplexing system,etc.The perfor⁃mance of the whole high speed swept testing system basically depends on the characteristics of the laser.To this end,based on the InGaAsP/InP gain chip’s excellent wide spectrum and Littman-Metcalf external-cavity feedback operating principle,a tunable laser with wide tuning range,high scanning speed and mode-hopping free is designed.In experiment,the maximum scanning speed of 240 nm/s,minimum step trigger interval of 0.001 nm,wavelength stability of better than±1.3 pm/1 min,absolute wavelength accuracy of less than 2.39 pm,power stability of better than±0.02 dB/1 min,and single longitudinal mode tunable output of 110 nm with mode-hopping free are realized.This study is helpful to promote the research process of the high speed swept testing system,and boost the testing ac⁃curacy and the testing efficiency of wavelength division multiplexing devices.

关 键 词：快速扫描系统 Littman-Metcalf 扫描速度 触发间隔 波分复用 

分 类 号：TN248.4[电子电信—物理电子学]