CMOS图像传感器辐射敏感参数测试电路设计及试验验证  

Test Circuit Design and Radiation Experiment Verification of CMOS Image Sensors

作　　者：王祖军[1,2] 聂栩 唐宁 王兴鸿 尹利元 晏石兴 李传洲 WANG Zujun;NIE Xu;TANG Ning;WANG Xinghong;YIN Liyuan;YAN Shixing;LI Chuanzhou(State Key Laboratory of Intense Pulsed Radiation Simulation and Effect(Northwest Institute of Nuclear Technology),Xi'an 710024,CHN;Xiangtan University,School of Materials Science and Engineering,Xiangtan 411105,CHN;Xi'an Research Institute of High-Technology,Xi'an 710024,CHN;Lanzhou University,School of Nuclear Science and Technology,Lanzhou 730000,CHN)

机构地区：[1]西北核技术研究所强脉冲辐射环境模拟与效应全国重点实验室,西安710024 [2]湘潭大学材料科学与工程学院,湖南湘潭411105 [3]西安高科技研究所,西安710024 [4]兰州大学核科学与技术学院,兰州730000

出　　处：《半导体光电》2024年第2期216-221,共6页Semiconductor Optoelectronics

基　　金：国家自然科学基金项目(U2167208,11875223);陕西省自然科学基础研究计划项目(2024JC-JCQN-10);全国重点实验室基金项目(NKLIPR1803,NKLIPR2012,NKLIPR2113)..

摘　　要：以航天领域广泛应用的CMV4000型CMOS图像传感器(CIS)为研究对象,通过开展CIS辐射敏感参数测试电路设计,将CIS辐照电路板与测试电路板中FPGA数据采集及传输板分离,辐照电路板与测试电路板通过接插口通信,从而实现开展辐照试验时对FPGA数据采集部分进行辐射屏蔽防护,避免FPGA数据采集板受到辐射影响。开展了CIS测试电路中的电源模块、数据采集、存储模块、外围电路等设计及PCB版图的布局布线设计。采用VerilogHDL硬件描述语言对各个功能模块进行驱动时序设计,实现CIS辐射敏感参数测试功能。通过开展CMV4000型CIS ^(60)Coγ射线辐照试验,分析了平均暗信号、暗信号非均匀性、暗信号分布等辐射敏感参数随总剂量增大的退化规律,验证了CIS辐射敏感参数测试系统的可靠性。This study investigated the CMV4000 CMOS image sensor(CIS),which is widely used in the space domain.When designing the test circuit,the CIS radiation circuit board was separated from the FPGA data acquisition and transmission board,and the radiation circuit board and test circuit board communicated through a communication interface to realize radiation shielding protection of the FPGA data acquisition part during a radiation test.This prevented the FPGA data acquisition board from being affected by radiation.The power supply module,data acquisition,memory module,peripheral circuit,and the layout and wiring of the PCB were designed.The Verilog HDL hardware description language was used to drive the timing design of each function module to realize the CIS radiation-sensitive parameter test function.A ^(60)Coγray radiation test of the CMV4000 CIS was used to analyze the degradation of radiation-sensitive parameters such as the mean dark signal,dark signal uniformity,and dark signal distribution versus total ionizing dose,and the reliability of the CIS radiation-sensitive parameter test system was verified.

关 键 词：CMOS图像传感器 测试电路设计 辐照试验 辐照损伤效应 辐射敏感参数 

分 类 号：TN386.5[电子电信—物理电子学] O605[理学—化学]