A Novel Method for Determining the Void Fraction in Gas-Liquid Multi-Phase Systems Using a Dynamic Conductivity Probe  

作　　者：Xiaochu Luo Xiaobing Qi Zhao Luo Zhonghao Li Ruiquan Liao Xingkai Zhang 

机构地区：[1]Hubei Key Laboratory of Oil and Gas Drilling and Production Engineering,Yangtze University,Wuhan,434000,China [2]Oil and Gas Engineering Research Institute,PetroChina Tarim Oilfield Company,Korla,84100,China [3]Xinjiang Kunlun Engineering Consulting Co.,Ltd.,Karamay,834000,China [4]Petrochina Dagang Oilfield Company Production Technology Research Institute,Tianjin,300000,China

出　　处：《Fluid Dynamics & Materials Processing》2024年第6期1233-1249,共17页流体力学与材料加工（英文）

基　　金：the National Natural Science Foundation of China(No.62173049);the Open Fund of the Hubei Key Laboratory of Oil and Gas Drilling and Production Engineering(Yangtze University),YQZC202309.

摘　　要：Conventional conductivity methods for measuring the void fraction in gas-liquid multiphase systems are typically affected by accuracy problems due to the presence of fluid flow and salinity.This study presents a novel approach for determining the void fraction based on a reciprocating dynamic conductivity probe used to measure the liquid film thickness under forced annular-flow conditions.The measurement system comprises a cyclone,a conductivity probe,a probe reciprocating device,and a data acquisition and processing system.This method ensures that the flow pattern is adjusted to a forced annular flow,thereby minimizing the influence of complex and variable gas-liquid flow patterns on the measurement results;Moreover,it determines the liquid film thickness solely according to circuit connectivity rather than specific conductivity values,thereby mitigating the impact of salinity.The reliability of the measurement system is demonstrated through laboratory experiments.The experimental results indicate that,in a range of gas phase superficial velocities 5–20 m/s and liquid phase superficial velocities 0.079–0.48 m/s,the maximum measurement deviation for the void fraction is 4.23%.

关 键 词：Forced annular flow dynamic conductivity probe void fraction gas-liquid flow liquid film thickness 

分 类 号：O35[理学—流体力学]