基于射线追踪的微波成像诊断极向位置修正  

Correction of poloidal position in microwave imaging diagnostics based on ray-tracing

作　　者：高远 杨州军 张智超 罗蔷 金子阳 高丽 潘垣 GAO Yuan;YANG Zhou-jun;ZHANG Zhi-chao;LUO Qiang;JIN Zi-yang;GAO Li;PAN Yuan(State Key Laboratory of Advanced Electromagnetic Engineering and Technology,School of Electrical and Electronic Engineering,Huazhong University of Science and Technology,Wuhan 430070)

机构地区：[1]华中科技大学电气与电子工程学院强电磁工程与新技术国家重点实验室,武汉430074

出　　处：《核聚变与等离子体物理》2024年第2期170-176,共7页Nuclear Fusion and Plasma Physics

基　　金：国家磁约束核聚变能发展研究专项(2018YFE0310300);国家自然科学基金(51821005)。

摘　　要：在微波成像诊断准光学设计中对等离子体介质对成像位置的影响进行了研究。采用射线追踪方法,在J-TEXT实验参数条件下,基于冷等离子体近似的色散关系,求解了电子回旋辐射成像(ECEI)诊断的极向成像位置。对比分析了射线追踪相较于传统准光学成像的成像位置的修正效果,发现聚焦位置位于高场侧和高密度等离子体情况下,实际观测位置与准光学设计位置有较大偏差。该修正提高了诊断数据测量的可靠性,优化了微波诊断信号分析。The influence of the plasma is studied in the quasi-optical design of microwave imaging diagnostics.The ray-tracing method is used to calculate the poloidal imaging position of ECEI diagnostic with J-TEXT experimental parameters.It is found that when the focusing position is located on the high-field side and the plasma density is high,the actual imaging position deviates greatly from the position of quasi-optical design.This correction will not only improve the reliability of diagnostic,but also provide a reference for analysis of signal,optimization of diagnostic operation interval and imaging optical design.

关 键 词：电子回旋辐射成像 准光学设计 射线追踪 

分 类 号：TL651[核科学技术—核技术及应用]