高分子薄膜表面缺陷检测系统的照明方案设计  

Design of Lighting Solutions for Surface Defect Detection System of Polymer Films

作　　者：邓海云 陈新辉 DENG Haiyun;CHEN Xinhui(College of Engineering,Shantou University,Shantou 515063,China)

机构地区：[1]汕头大学工学院,广东汕头515063

出　　处：《机械》2024年第6期67-74,共8页Machinery

基　　金：广东省科技专项资金(STKJ2023056)。

摘　　要：阐述了高分子薄膜表面存在的缺陷类型及其可能造成的危害,着重介绍了工业视觉检测系统中光源对高分子薄膜表面缺陷特征成像的影响。为寻求能够最大程度呈现高分子薄膜表面缺陷特征的光源照明方案,通过分析高分子薄膜的光学特性和专用光源的相关特性,结合高分子薄膜表面缺陷的特点,设计了多组光源方案对比实验。实验结果显示,僵块和黑点类缺陷在红色、白色和绿色LED光源以正向背光、角度背光和侧向角度等照射方式均能较好地呈现特征;条纹和死皱类缺陷受光源颜色影响较小,当光源以侧向角度和角度背光照射时这两类缺陷特征较为明显,而以正向背光照射时几乎没有特征呈现;活皱缺陷仅在绿色光源以角度背光照射时特征较为清楚。综合各类缺陷在不同照明方案下的特征呈现效果,实现了高分子薄膜表面缺陷检测系统的照明方案设计。This study elaborates on various types of defects on the surface of polymer films and the potential hazards,with a focus on the impact of light sources in industrial visual inspection systems on the imaging of the surface defect features of polymer films.In order to seek a lighting solution that can maximize the presentation of the surface defects of polymer films,the optical features of polymer films and the relevant features of specialized light sources are analyzed,combined with the features of surface defects of polymer films,multiple sets of lighting solutions for comparative experiments are designed.The experimental results show that rigid blocks and black spot defects exhibit the features well in red,white,and green LED light sources illuminated by forward backlight,angled backlight,and lateral lighting;stripes and dead wrinkles are less affected by the color of the light source,and when the light source is illuminated with lateral and angled backlight,the features of these two types of defects are more obvious,while forward backlight reveals almost no features;the wrinkle defects are only clearly characterized when the green light source is illuminated with angled backlight.By integrating the feature presentation of various defects under different lighting solutions,the lighting solution design of the polymer film surface defect detection system is achieved.

关 键 词：高分子薄膜缺陷 机器视觉 光源 缺陷检测 

分 类 号：TP23[自动化与计算机技术—检测技术与自动化装置] TB43[自动化与计算机技术—控制科学与工程]