透射电镜强磁场原位样品台的研发及其应用  

Development of in⁃situ magnetizing holder for transmission electron microscope and its application

作　　者：孙鑫 覃家转 白天 赵之赫 夏卫星 陈仁杰 闫阿儒 SUN Xin;QIN Jiazhuan;BAI Tian;ZHAO Zhihe;XIA Weixing;CHEN Renjie;YAN Aru(School of Materials Science and Chemical Engineering,Ningbo University,Ningbo Zhejiang 315211;CISRI&NIMTE Joint Innovation Center for Rare Earth Permanent Magnets,NingboInstitute of Material Technology and Engineering,Chinese Academy of Science,Ningbo Zhejiang 315201,China)

机构地区：[1]宁波大学材料科学与化学工程学院,浙江宁波315211 [2]稀土永磁材料联合创新中心,中国科学院宁波材料技术与工程研究所,浙江宁波315201

出　　处：《电子显微学报》2024年第3期346-353,共8页Journal of Chinese Electron Microscopy Society

基　　金：宁波市重大科技任务攻关项目(No.2023Z099);宁波材料技术与工程研究所所长基金(No.E21301QF01).

摘　　要：本文介绍了一种可施加水平强磁场的透射电镜样品台。通过降低磁场发生端面沿电子束方向的厚度,实现了增加磁场强度时较小的电子束偏折角度,在施加较强水平磁场的情况下仍然可以清晰地成像。在加速电压为200 kV的透射电镜中能够施加的最大磁场数值为075 T,远高于国际上现有装置的数值。利用该样品台成功观察了饱和磁场为06 T的AlNiCo磁体样品的磁化过程。In this paper,we developed an in-situ magnetizing holder for transmission electron microscope with a strong in-plane magnetic field.By reducing the thickness of pole surface along electron beam direction,a small deflection angle of electron beam was realized when the intensity of magnetic field was increased.A clear image was obtained under a strong in-plane field.The maximum field strength was estimated to be 075 T by calculating the field distribution through finite element method and measuring the beam deflection angle,much higher than ever reported values.The magnetization process of AlNiCo sample with a saturation field of 06 T was observed by the holder inside of TEM operated at 200 kV,confirming the field strength and the good imaging condition of the developed holder.

关 键 词：原位磁场样品台 洛伦兹透射电镜 磁畴 铝镍钴 

分 类 号：TH73[机械工程—仪器科学与技术] TM273[机械工程—精密仪器及机械] O737[一般工业技术—材料科学与工程]