冷屏对红外焦平面探测器组件性能的影响  

The impact of cold screens on the performance of infrared focal plane detector component

作　　者：甘玉梅 赵农 于小兵 GAN Yu-mei;ZHAO Nong;YU Xiao-bing(11th Research Institute of CETC,Beijing 100015,China)

机构地区：[1]中国电子科技集团公司第十一研究所,北京100015

出　　处：《激光与红外》2024年第6期924-928,共5页Laser & Infrared

摘　　要：分析了国内早期中波320×256红外焦平面探测器组件与国外同类产品在装机性能上的差异,采用三种实验方法检测了国内外探测器组件的光电性能,通过对探测器组件光电转换和结构的分析,确定出杂散光在冷屏内部的反射是导致测试结果差异的原因,冷屏内表面黑化层和结构形式是影响组件实际应用的关键。冷屏结构改进后,有效改善了国内探测器组件的实际应用性能。In this paper,the differences in installed performance between early domestic medium-wave 320×256 infrared focal plane detector components and their foreign counterparts are analyzed.Three experimental methods are employed to test the photoelectric performance of detector components at home and abroad.By analyzing the photoelectric conversion and structure of the detector components,it is determined that the reflection of stray light inside the cold screen is the reason for the difference in the test results,and the blackened layer on the inner surface of the cold screen and the form of its structure are key to the practical application of the component.The improved structure of the cold screen effectively improves the practical application performance of domestic detector modules.

关 键 词：冷屏 辐射 红外焦平面探测器 杂散光 

分 类 号：TN214[电子电信—物理电子学] TN205