数模转换电路中的线性参数测试方法分析  

Analysis of Linear Parameter Testing Methods in Digital to Analog Conversion Circuits

作　　者：刘思嘉 郭焕焕 熊耀斌 何忠名 赵彦飞[1] 汪翔[1] LIU Sijia;GUO Huanhuan;XIONG Yaobin;HE Zhongming;ZHAO Yanfei;WANG Xiang(Material Center of China Academy of Launch Vehicles,Beijing 100076,China)

机构地区：[1]中国运载火箭技术研究院物资中心,北京100076

出　　处：《电子技术（上海）》2024年第4期30-31,共2页Electronic Technology

摘　　要：阐述由于数模转换器的输出为模拟量,其线性参数的测试无法像模数转换器一样可以直接用统计学的方法获取。为此,分析几种适用于数模转换器线性参数的测试方法,并结合航天用元器件的特点,总结不同测试方法的测试要求。This paper describes that due to the analog output of analog-to-digital converters,the testing of their linear parameters cannot be directly obtained using statistical methods like analog-todigital converters.It analyzes several testing methods applicable to linear parameters of analog-todigital converters,and summarizes the testing requirements of different testing methods based on the characteristics of aerospace components.

关 键 词：数模转换器 线性参数 模数转换器 测试方法 

分 类 号：TN407[电子电信—微电子学与固体电子学] TN707