微量Fe、Si对铝导电杆组织与性能的影响  

Effect of micro Fe and Si on microstructure and properties of aluminum conductive rod

作　　者：金胜 李红英[1] 孔耀颉 姜雁斌 饶茂 杨奇锋 王选理 JIN Sheng;LI Hongying;KONG Yaojie;JIANG Yanbin;RAO Mao;YANG Qifeng;WANG Xuanli(School of Materials Science and Engineering,Central South University,Changsha 410083,China;Southwest Aluminum(Group)Co.,Ltd.,Chongqing 401326,China;Hunan Valin Cable Co.,Ltd.,Xiangtan 411104,China)

机构地区：[1]中南大学材料科学与工程学院,长沙410083 [2]西南铝业(集团)有限责任公司,重庆401326 [3]湖南华菱线缆股份有限公司,湘潭411104

出　　处：《中国有色金属学报》2024年第7期2188-2199,共12页The Chinese Journal of Nonferrous Metals

基　　金：国家自然科学基金资助项目(52274403)。

摘　　要：采用电子背散射衍射(EBSD)、扫描电镜(SEM)、透射电镜(TEM)、扫描探针显微镜(SPM)、室温拉伸、单臂电桥和纳米压痕蠕变等方法,研究了微量Fe、Si对铝导电杆组织与性能的影响。结果表明:Fe、Si能够降低导电杆的晶粒尺寸,并使织构组分由弱〈001〉+〈111〉双织构向强〈111〉织构转变,产生沿挤压方向分布的Al-Fe和Al-Fe-Si相,且在第二相和(亚)晶界处出现位错塞积;Fe、Si通过粗颗粒促进再结晶和细颗粒抑制再结晶的共同作用,造成导电杆的显微组织沿径向出现周期性交替分布;Fe、Si能够在牺牲较小导电率的前提下,显著提高铝导电杆的强度和抗蠕变性能。The effects of Fe and Si on the microstructure and properties of aluminum conductive rod were investigated by electron backscatter diffraction(EBSD),scanning electron microscopy(SEM),transmission electron microscopy(TEM),scanning probe microscopy(SPM),room temperature tensile,single arm bridge and nanoindentation creep.The results indicate that Fe and Si can reduce the grain size of the conductive rod,making the texture component change from weak〈001〉+〈111〉double texture to sharp〈111〉texture.The presence of Al-Fe and Al-Fe-Si phases is observed to be distributed along the extrusion direction,and appear obvious dislocation pile-up at the second phase and(sub)grain boundary.Fe and Si promote recrystallization through coarse particles and inhibit recrystallization through fine particles,resulting in periodic alternating distribution of the microstructure of the conductive rod along the radial direction.Fe and Si can significantly improve the strength and creep resistance of aluminum conductive rod at the expense of small conductivity.

关 键 词：FE SI 铝导电杆 动态再结晶 强度 导电率 蠕变 

分 类 号：TG146.2[一般工业技术—材料科学与工程]