低轨等离子体环境中航天器充电研究及在轨试验  

Research on Spacecraft Charging in Low Orbit Plasma Environment and in Orbit Experiments

作　　者：王润福 孙迎萍[1] 刘海波[1] WANG Runfu;SUN Yingping;LIU Haibo(Lanzhou Institute of Physics,Lanzhou 730000,China)

机构地区：[1]兰州空间技术物理研究所,兰州730000

出　　处：《空间科学与试验学报》2024年第1期102-109,共8页Journal of Space Science and Experiment

摘　　要：低轨道等离子体环境与航天器相互作用下将产生高充电电位,引起航天器充放电效应并对航天器能源系统、电子系统及航天员出舱活动等产生危害。本文开展了等离子体环境与航天器相互作用机理和规律研究,通过理论计算和仿真分析,建立了低轨道航天器充电模型,并进行了在轨试验验证,为低轨航天器等离子试验模型提供了理论支撑,具有重要的科学意义。The interaction between low orbit plasma environment and spacecraft will generate high charging potential,which may cause damage to spacecraft energy systems,electronic systems,and astronaut extravehicular activities due to spacecraft charging and discharging effects.This article conducts research on the interaction mechanism and laws between plasma environment and spacecraft.Through theoretical calculation and simulation analysis,a charging model for low orbit spacecraft is established,and in orbit experiments are conducted to verify it.This provides theoretical support for the plasma test model of low orbit spacecraft and has important scientific significance.

关 键 词：低轨道航天器 充电 悬浮电位 电位检测探头 在轨试验 

分 类 号：V44[航空宇航科学与技术—飞行器设计]