基于ATE的千级数量管脚FPGA多芯片同测技术  

Research on multi-chip simultaneous testing method for field programmable gate arrays

作　　者：秦立君 余永涛 罗军[1] 李军求[1] 庞水全 Qin Lijun;Yu Yongtao;Luo Jun;Li Junqiu;Pang Shuiquan(The Fifth Electronics Research Institute of Ministry of Industry and Information Technology,Guangzhou 510610,China)

机构地区：[1]工业和信息化部电子第五研究所,广东广州510610

出　　处：《电子技术应用》2024年第7期51-54,共4页Application of Electronic Technique

基　　金：广东省基础与应用基础研究基金(2021A1515110939)。

摘　　要：随着超大规模FPGA芯片技术发展,芯片管脚数量提升到1000以上,如何实现超大规模多引脚FPGA芯片高效测试成为ATE在线测试难点。针对一款千级数量管脚超大规模的FPGA芯片,基于FPGA的可编程特性,采用多芯片有效pin功能并行测试和单芯片全pin电性能参数测试相结合的方法进行ATE测试,实现了千级数量管脚FPGA芯片的4芯片同测,测试效率提升3倍多。With the development of ultra-large scale FPGA chip technology,the number of chip pins has increased to over 1000.How to achieve efficient testing of ultra-large scale multi-pin FPGA chips has become a challenge for ATE online testing.For a large-scale FPGA chip with thousands of pins,based on the programmable characteristics of FPGA,ATE testing was carried out using a combination of multi-chip effective pin function parallel testing and single chip full pin electrical performance parameter testing,achieving 4-chip simultaneous testing of thousands of pin FPGA chips,and improving testing efficiency by more than three times.

关 键 词：现场可编程门阵列 自动化测试系统 多芯片同测 功能测试 

分 类 号：TN47[电子电信—微电子学与固体电子学]