晶粒尺寸对多层陶瓷电容器可靠性能的影响与机理  

The Influence and Mechanism of Grain Size on the Reliability of Multilayer Ceramic Capacitors

作　　者：吕烨同 覃业霞 王梅 杨帅俊 张蕾 LÜYetong;QIN Yexia;WANG Mei;YANG Shuaijun;ZHANG Lei(School of Environment and Energy,South China University of Technology,Guangzhou 511400,China;Shenzhen Institute of Advanced Electronic Materials,Shenzhen Institutes of Advanced Technology,Chinese Academy of Sciences,Shenzhen 518055,China)

机构地区：[1]华南理工大学环境与能源学院,广州511400 [2]深圳先进电子材料国际创新研究院,深圳518100

出　　处：《华南师范大学学报（自然科学版）》2024年第3期1-8,共8页Journal of South China Normal University(Natural Science Edition)

基　　金：科技部重点研发计划项目(2022YFB3807400);广东省自然科学基金面上项目(2022A1515012604)。

摘　　要：通过改变BaTiO_(3)基薄层多层陶瓷电容器(MLCC)的晶粒尺寸,探究其对MLCC性能的影响。通过拉曼光谱、电容温度系数(TCC)曲线、偏压特性、伏安(I-V)特性曲线、变温阻抗谱、击穿电压威布尔分布(BDV)和高加速寿命老化(HALT)等全面系统研究了晶粒尺寸对MLCC的电学性能和可靠性的影响。结果表明:晶粒尺寸显著影响MLCC的偏压稳定性和可靠性。细晶粒MLCC由于具有较高的晶界密度,使其晶界、界面激活能和肖特基势垒得以提高,显著增强了器件的击穿强度和抗老化能力,展现出更好的可靠性。研究结果可以为国内MLCC性能提升提供理论支持和技术指导。The effects of grain size on the performance of BaTiO_(3)-based thin-layer Multilayer Ceramic Capacitors(MLCC)was investigated.A comprehensive and systematic study was conducted using Raman spectroscopy,temperature coefficient of capacitance(TCC)curves,bias characteristics,volt-ampere(I-V)characteristic curves,variable temperature impedance spectroscopy,Weibull distribution of breakdown voltage(BDV),and highly accelerated life testing(HALT)to assess the effects of grain size on the electrical properties and reliability of MLCCs.It was found that grain size plays a significant role in the bias stability and reliability of MLCCs.Fine-grained MLCCs,due to their higher grain boundary density,exhibit increased grain boundary and interface activation energy,as well as enhanced Schottky barriers.These factors contribute to a notable improvement in the breakdown strength and resistance to aging,thereby enhancing the overall reliability of the devices.The findings provide valuable theoretical insights and technical guidance for improving the performance of domestically produced MLCCs.

关 键 词：陶瓷电容器 钛酸钡 晶粒尺寸 晶界密度 可靠性 

分 类 号：TQ174[化学工程—陶瓷工业]