Tolansky干涉测量平行透明材料折射率方法探究  

Exploring the method of measuring the refractive index of parallel transparent materials by tolansky interferometer

作　　者：许子杰 张宝武[1] 施江焕 欧阳烨锋 朱玲 方振远 XU Zijie;ZHANG Baowu;SHI Jianghuan;OUYANG Yefeng;ZHU Lin;FANG Zhenyuan(College of Metrology Measurement and Instrument,China Jiliang University,Hangzhou 310018,China;Ningbo Institute of Metrology and Testing(Ningbo New Material Inspection and Testing Center),Ningbo 315048,China)

机构地区：[1]中国计量大学计量测试与仪器学院,浙江杭州310018 [2]宁波市计量测试研究院(宁波新材料检验检测中心),浙江宁波315048

出　　处：《光学技术》2024年第4期459-465,共7页Optical Technique

基　　金：国家市场监督管理总局科技计划项目资助(2022MK220);国家重点研发计划(2023YFF0616203,2021YFF0603300)。

摘　　要：为提高平行透明材料折射率的测量精度,提出了一种基于Tolansky干涉的折射率测量方法。通过几何光学理论的分析,建立了Tolansky干涉同心圆环的圆心侧移量与折射率之间的关系;构建了一个平行透明材料折射率测量仿真模型,对测量方法进行了虚拟实验研究,考察了方法的可行性;搭建了实验系统完成玻璃薄片折射率的测量,并与其他仪器进行了比较。实验结果表明,在测得材料旋转角度、干涉圆环圆心侧移量和材料厚度后,所得折射率计算值与理论值之间的相对误差仅为0.11%,为折射率高精度测量提供了一种新的可行方案。不确定评定结果显示,这种方法的测量结果受被测材料的厚度影响最大。To improve the measurement accuracy of refractive index of parallel transparent materials,a refractive index measurement method based on Tolansky interference is proposed.Through the analysis of geometric optics theory,the relationship between the lateral displacement of the center of the Tolansky interference concentric ring and the refractive index was established.A parallel transparent material refractive index measurement simulation model was constructed,virtual experimental research on the measurement method was conducted,and the feasibility of the method was examined.An experimental system was built to measure the refractive index of glass sheets,which was compared with other instruments.The experimental results show that after measuring the material rotation angle,interference ring center lateral displacement,and material thickness,the relative error between the calculated refractive index value and the theoretical value is only 0.11%,providing a new feasible solution for high-precision measurement of refractive index.The uncertain evaluation results indicate that the measurement results of this method are most affected by the thickness of the tested material.

关 键 词：物理光学 折射率 Tolansky干涉 同心圆环 

分 类 号：O436[机械工程—光学工程]