孕穗期弱光胁迫对水稻谷粒性状的影响  

Effects of Weak Light Stress on Grain Traits of Rice during Booting Stage

作　　者：耿立清 GENG Liqing(Liaoning Agricultural Science and Technology Achievement Transformation Service Center,Shenyang 110161,China)

机构地区：[1]辽宁省农业科技成果转化服务中心,沈阳110161

出　　处：《农业科技与装备》2024年第1期6-7,共2页Agricultural Science & Technology and Equipment

摘　　要：以千重浪2号为试材,在盆栽条件下研究了孕穗期弱光胁迫对谷粒性状的影响及谷粒性状与粒质量的关系。结果表明,孕穗期弱光胁迫显著降低了谷粒的长度、宽度、厚度、面积、体积和质量;降低幅度最大的处理时期是叶龄余数为1.0时,强、中、弱势粒的千粒质量分别比对照降低了7.89%、5.70%和12.38%。相关分析表明,随着谷粒长、宽和厚的增加,千粒质量也明显增加。With Qianchonglang No.2 as the test material,the effect of weak light stress on grain traits and the relationship between grain traits and grain quality during booting stage were studied under pot conditions.The results showed that the weak light stress during booting stage significantly reduced the length,width,thickness,area,volume and quality of grain;In the treatment period,when the residual of leaf age was 1.0,the 1000-grain mass of strong,medium and weak grains decreased by 7.89%,5.70%and 12.38%,respectively.The correlation analysis showed that with the increase of grain length,width and thickness,the 1000-grain mass also increased significantly.

关 键 词：水稻 谷粒 谷粒充实度 

分 类 号：S511[农业科学—作物学]