原子力红外显微镜(AFM-IR):成像原理及方法综述  

Atomic Force Microscopy-based Infrared Spectroscopy(AFM-IR):A Review of Imaging Principles and Methods

作　　者：罗放 Luo Fang(SINOPEC(Beijing)Research Institute of Chemical Industry Co.,Ltd.,Beijing 100013)

机构地区：[1]中石化(北京)化工研究院有限公司,北京100013

出　　处：《中外能源》2024年第8期68-76,共9页Sino-Global Energy

摘　　要：综述了基于原子力显微镜的红外光谱(Atomic force microscopy-based infrared spectroscopy,AFM-IR)的特点,测量和检测原理及其技术优势。AFM-IR是能在纳米尺度对不同材料进行表征的新兴技术,该技术可以以远低于常规光学衍射极限的分辨率检测材料的化学成分,同时提供不同组分的分布图谱。AFM-IR的原理是利用原子力显微镜(AFM)悬臂梁的振动检测样本因吸收红外辐射脉冲产生的热膨胀,因此AFM-IR在继承了AFM的纳米级分辨率的基础上结合了红外光谱的化学分析能力,克服了二者原有的缺点并实现了优势互补。这项新技术在过去十多年备受关注并获得了长足的发展,因其操作简便、系统稳定、样品制备要求相对较低,以及与红外光谱直接相关而无需数学建模或额外数据后续处理,已被广泛用于材料科学、生命科学等诸多领域。The characteristics,measurement and detection principles,and technical advantages of atomic force microscopy-based infraredspectroscopy(AFM-IR)are reviewed.As an emerging technology that can character-ize different materials at the nanoscale,AFM-IR can detect the chemicalcomposition of materials at a resolu-tion far below the conventional optical diffraction limit,while providing a distribution map of different compo-nents.The principle of AFM-IR is to use the vibration of cantilever beam of atomic force microscope(AFM)to detect the thermal expansion of samples due to the absorption of infrared radiation pulse,therefore,AFM-IR inherits the nanoscale resolution of AFM and combines the chemical analysis ability of infrared spec-troscopy,overcoming the shortcomings of ARM and IR and achieving complementaryadvantages.This new technology has attracted much attention and gainedconsiderable development in the past decade,and has been widely used in materials science,life science and many other fields due to its easy operation,system stability,relatively low sample preparation requirements,and direct correlation with infrared spectroscopy without the need for mathematical modelling or additional data follow-up processing.

关 键 词：原子力红外显微镜 AFM-IR 

分 类 号：TH742[机械工程—光学工程]