集成电路模拟开关的测试策略分析  

Analysis of Testing Strategies for Analog Switches in Integrated Circuits

作　　者：唐光睿 TANG Guangrui(Guizhou Zhenhua Fengguang Semiconductor Co.,Ltd.,Guizhou 550018,China)

机构地区：[1]贵州振华风光半导体股份有限公司,贵州550018

出　　处：《电子技术（上海）》2024年第5期246-247,共2页Electronic Technology

摘　　要：阐述集成电路器件中的模拟开关特点,器件的测试方法,包括静态测试方法、动态测试方法、冷热测试方法、模拟仿真测试方法和辐射测试方法,为实际应用提供全面、系统的测试方案。This paper describes the characteristics of analog switches in integrated circuit devices,the testing methods of devices,including static testing methods,dynamic testing methods,cold and hot testing methods,simulation testing methods,and radiation testing methods,in order to provide a comprehensive and systematic testing plan for practical applications.

关 键 词：集成电路 模拟开关 器件测试 

分 类 号：TN407[电子电信—微电子学与固体电子学]