微波天线测量扫描架系统机械误差分析与精度设计  

Mechanical Error Analysis and Accuracy Design of Scanner in the Near Field Measurement System

作　　者：任大伟 葛鲁宁 杨涛 REN Dawei;GE Luning;YANG Tao(Shanghai Laitian Communications Technology LLC,Shanghai 201203,China)

机构地区：[1]上海莱天通信技术有限公司,上海201203

出　　处：《机械工程师》2024年第8期142-145,共4页Mechanical Engineer

摘　　要：微波测量系统中,平面近场系统的应用越来越广阔,对测试效率的要求越来越高,待测件扫描面积越来越大,扫描定位精度越来越高。除了环境因素影响外,机械自身精度是限制扫描定位精度的主要原因,特别是特大型扫描架系统(一般X轴行程达20 m,Y轴行程达12 m)。文中主要针对扫描架机械误差进行精度设计,并通过实际工程案例予以检验,为后续大型扫描架机械系统设计提供可靠的方法指导和工程经验支撑。In the microwave measurement system,the application of planar near-field system becomes more and more extensive,which requires higher testing efficiency,larger scanning area and higher scanning positioning accuracy.In addition to environmental factors,mechanical accuracy is the main reason for limiting the accuracy of scanning positioning,especially for very large scanning mechanical systems(generally X-axis travel can be up to 20 m and Y-axis travel can be up to 12 m).This paper mainly analyzes the mechanical error of the scanner system for precision design,and make a verification through actual engineering project,which can provide reliable guidance and engineering experience support to the large-scale scanner mechanical system design in the future.

关 键 词：微波天线测量 平面近场 扫描架系统 机械误差分析 精度设计 

分 类 号：TN820[电子电信—信息与通信工程]