微光CMOS传感器调制传递函数快速测试方法  

Festing Testing Method for Modulation Transfer Function of Low-Light Level CMOS Sensor

作　　者：唐卓 王劲松[1,2] 牛群 刘小华 Tang Zhuo;Wang Jinsong;Niu Qun;Liu Xiaohua(School of Optoelectronic Engineering,Changchun University of Science and Technology,Changchun 130022,Jilin,China;Zhongshan Institute of Changchun University of Science and Technology,Zhongshan 528437,Guangdong,China)

机构地区：[1]长春理工大学光电工程学院,吉林长春130022 [2]长春理工大学中山研究院,广东中山528437

出　　处：《激光与光电子学进展》2024年第12期287-293,共7页Laser & Optoelectronics Progress

基　　金：吉林省重点科技研发项目(20180201025GX)。

摘　　要：为满足微光CMOS图像传感器调制传递函数快速检测的需求,通过优化倾斜刃边法提出一种基于超采样模型的调制传递函数快速测试方法。测试过程采用自适应双阈值Canny边缘检测算法提高刃边检测精度,通过刃边角度空间几何旋转对边缘扩展响应进行超采样,并利用三次费米函数等效模型进行拟合,极大消除自然微光成像中噪声对测试结果的影响。利用该方法对CMOS传感器进行实际测试,采用不同目标图片测试实验结果同标准量进行对比,误差均在0.06之内,证明了该方法的可行性与有效性,符合CMOS传感器性能检测的要求。We propose a fast testing method based on an oversampling model to meet the demands for rapid modulation transfer function detection in low-light level CMOS image sensors.This method optimizes the inclined edge technique to enhance its accuracy.The testing procedure employs an adaptive dual-threshold Canny edge detection algorithm to enhance edge detection precision.Geometrically rotating the edge angle space oversamples the edge extension response,and we accomplish fitting using the cubic Fermi function equivalent model.This approach significantly mitigates the influence of noise on testing outcomes during natural low-light imaging.When applying this method for practical CMOS sensor testing,we compared the experimental results with the standard values using various target images,and errors remained within 0.06.These findings validate the feasibility and effectiveness of this method,fulfilling the requirements for CMOS sensor performance assessment.

关 键 词：调制传递函数 微光传感器 倾斜刃边法 边缘超采样 快速检测 

分 类 号：TN386.5[电子电信—物理电子学]