太阳短波极紫外双波段成像光谱仪设计  

Design for Solar Short Extreme Ultraviolet Dual-Waveband Imaging Spectrometer

作　　者：段紫雯 邢阳光 彭吉龙[2] 闫雷 黄一帆[1] 刘越[1] 李林[1] Duan Ziwen;Xing Yangguang;Peng Jilong;Yan Lei;Huang Yifan;Liu Yue;Li Lin(School of Optics and Photonics,Beijing Institute of Technology,Beijing 100081,China;Beijing Institute of Spacecraft Environment Engineering,Beijing 100094,China;Purple Mountain Observatory,Chinese Academy of Sciences,Nanjing 210023,Jiangsu,China;Beijing Institute of Astronautical Systems Engineering,Beijing 100076,China)

机构地区：[1]北京理工大学光电学院,北京100081 [2]北京卫星环境工程研究所,北京100094 [3]中国科学院紫金山天文台,江苏南京210023 [4]北京宇航系统工程研究所,北京100076

出　　处：《光学学报》2024年第12期285-298,共14页Acta Optica Sinica

基　　金：国家自然科学基金(62205027,42274208);中国科学院战略性先导科技专项(XDA15018300)。

摘　　要：基于超环面变线距(TVLS)光栅设计太阳短波极紫外的双波段成像光谱仪,光谱仪系统采用非罗兰圆的光栅工作结构,不需要光谱的扫描或探测器的位移即可同时获得17~21 nm和28~32 nm两个波段的高空间、高光谱分辨和大瞬时狭缝视场的消像散光谱成像。基于蒙特卡罗统计模拟方法对太阳短波极紫外双波段成像光谱仪的最优模型开展光线追迹仿真实验,仿真结果表明其空间分辨率优于1″,光谱分辨率优于0.0055 nm,所设计的成像光谱仪具有良好的光栅像差校正效果,其光谱成像性能接近衍射极限。为我国未来的太阳极紫外光谱成像仪器的发展研制提供重要的理论意义,为我国未来的太阳空间探测任务的型号遴选提供重要的参考价值。Objective Spectroscopic imaging observations in the extreme ultraviolet(EUV)short-wavelength range(10‒40 nm)provide rich information about eruptive solar activities in the upper solar atmosphere.Meanwhile,they encompass emission spectral lines from multi-charged ions(e.g.,high-charge iron ions,helium ions,and magnesium ions)with electron excitation temperatures ranging from 104‒107 K.Such observations play a crucial role in diagnosing plasma temperature,density,and velocity in the solar corona,making the He II 30.4 nm emission spectral line particularly significant for diagnosing small-scale solar eruptive events and conducting global helium abundance measurements.However,regardless of whether launched in the past or currently in orbit,existing imaging spectrometers worldwide face limitations in performing high-spatial and high-spectral resolution diagnostic observations in the EUV short-wavelength range encompassing the He II line.Therefore,we propose and design a solar EUV imaging spectrometer capable of simultaneously operating in the 17‒21 nm and 28‒32 nm wavebands,which features a large off-axis slit for wide field-ofview(FOV)imaging.The instrument utilizes a non-Roland grating structure and a toroidal varied-line-space(TVLS)grating design,enabling simultaneous acquisition of high-spatial and high-spectral resolution,and large instantaneous slit FOV imaging without the need for spectral scanning or detector displacement.Methods The slit scanning solar EUV imaging spectrometer utilizes a narrow slit to restrict the FOV and employs a combination of slit scanning,concave grating,and a two-dimensional flat field detector to achieve high spatial and spectral resolution imaging over a two-dimensional area.Solar EUV radiation passes through a preceding off-axis telescope primary mirror,forming a real image at the telescope focal plane.A narrow slit positioned at the telescope focal plane captures a portion of the image by the instantaneous FOV(IFOV).The light passing through the slit undergoes TVLS grating

关 键 词：光学器件 太阳空间探测 太阳极紫外 成像光谱仪 光栅像差校正 光线追迹 

分 类 号：O434[机械工程—光学工程]