Sensing nanoscale electromagnetic forces when the heat is on  

作　　者：Eric O.Potma 

机构地区：[1]Department of Chemistry,University of California,Irvine,CA 92697,USA

出　　处：《National Science Review》2024年第7期58-59,共2页国家科学评论（英文版）

摘　　要：In scanning probe microscopy(SPM),a sharp tip scans across a sample to produce an image with nanometer-scale resolution or better.SPM contrast is derived from the physical interplay between the tip and the sample.A special class of SPM techniques measures forces when the tip–sample junction is illuminated by an external light source.Photo-induced forces can be sensitive to the optical properties of the sample,thus enabling nanoscale imaging with spectroscopic,material-specific contrast.

关 键 词：FORCES NANOSCALE SPM 

分 类 号：O647.5[理学—物理化学] TM912[理学—化学]