Spectral-interferometry-based diff-iteration for high-precision micro-dispersion measurement  

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作  者:WEI DU JINGSHENG HUANG YANG WANG MAOZHONG ZHAO JUAN LI JUNTAO HE JINDONG WANG WENFU ZHANG TAO ZHU 

机构地区:[1]Key Laboratory of Optoelectronic Technology&System(Ministry of Education),Chongqing University,Chongqing 400044,China [2]State Key Laboratory of Transient Optics and Photonics,Xi’an Institute of Optics and Precision Mechanics,Chinese Academy of Sciences,Xi’an 710119,China

出  处:《Photonics Research》2024年第6期1362-1370,共9页光子学研究(英文版)

基  金:National Key Research and Development Program of China(2023YFF0715700);College of Optoelectronic Engineering(Chongqing University)(GDYKC202409);National Natural Science Foundation of China(62075021,62205036);National Science Fund for Distinguished Young Scholars(61825501);Chongqing Natural Science Foundation of Innovative Research Groups(cstc2020jcyj,cxttX0005).

摘  要:Precise measurement of micro-dispersion for optical devices(optical fiber,lenses,etc.)holds paramount significance across domains such as optical fiber communication and dispersion interference ranging.However,due to its complex system,complicated process,and low reliability,the traditional dispersion measurement methods(interference,phase shift,or time delay methods)are not suitable for the accurate measurement of micro-dispersion in a wide spectral range.Here,we propose a spectral-interferometry-based diff-iteration(SiDi)method for achieving accurate wide-band micro-dispersion measurements.Using an optical frequency comb,based on the phase demodulation of the dispersion interference spectrum,we employ the carefully designed SiDi method to solve the dispersion curve at any position and any order.Our approach is proficient in precisely measuring micro-dispersion across a broadband spectrum,without the need for cumbersome wavelength scanning processes or reliance on complex high-repetition-rate combs,while enabling adjustable resolution.The efficacy of the proposed method is validated through simulations and experiments.We employed a chip-scaled soliton microcomb(SMC)to compute the dispersion curves of a 14 m single-mode fiber(SMF)and a 0.05 m glass.Compared to a laser interferometer or the theoretical value given by manufacturers,the average relative error of refractive index measurement for single-mode fiber(SMF)reaches 2.8×10^(-6) and for glass reaches 3.8×10^(-6).The approach ensures high precision,while maintaining a simple system structure,with realizing adjustable resolution,thereby propelling the practical implementation of precise measurement and control-dispersion.

关 键 词:interferometer dispersion ITERATION 

分 类 号:TH74[机械工程—光学工程]

 

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