红外材料光谱发射率与半球发射率测量方法研究  

Research on Measurement Method for Spectral Emissivity and Hemispherical Emissivity of Infrared Materials

作　　者：王瑞琴 韩颖[1] 高原[1] WANG Ruiqin;HAN Ying;GAO Yuan(China Airborne Missile Academy,Luoyang 471000,China)

机构地区：[1]中国空空导弹研究院,洛阳471000

出　　处：《宇航计测技术》2024年第4期40-43,81,共5页Journal of Astronautic Metrology and Measurement

基　　金：中国空空导弹研究院众创项目(CB23073)。

摘　　要：针对红外材料表面发射率准确测量的迫切需求,在实验室常温环境下,分别利用搭载积分球附件的光谱测量设备与便携式发射率测量仪,对样品材料表面的定向光谱发射率和半球全发射率进行了测量,并对结果进行转化。通过两种测量方法的对比研究,表明红外材料的光谱发射率与半球发射率测量结果具有一致性,验证了所述测量方法的有效性,为红外材料表面发射率参数的测量提供了参考。In response to the demand for accurate measurement of surface emissivity of infrared materials,the directional spectral emissivity and hemispherical total emissivity of the sample materials were measured using a spectral equipment with integrating sphere attachment and a emissometer at room temperature in the laboratory,and the results were converted.Through the study of the two measurement methods,it is shown that the spectral emissivity of infrared materials is consistent with the hemispherical total emissivity,which verifies the effectiveness of the two measurement methods and provides a reference for the measurement of surface emissivity parameters of infrared materials.

关 键 词：光谱发射率 半球发射率 积分球反射计 发射率测量仪 

分 类 号：TH741[机械工程—光学工程] V44[机械工程—仪器科学与技术]