基于ATE的通用源表程控系统设计与验证  

Design and verification of universal source table program control system based on ATE

作　　者：廖勇 白洋 李佳俊 谢栋材 霍昕垚 LIAO Yong;BAI Yang;LI Jiajun;XIE Dongcai;HUO Xinyao(China Aerospace Science&Industry Corp Defense Technology R&T Center,Beijing 100854,China)

机构地区：[1]航天科工防御技术研究试验中心,北京100854

出　　处：《无线互联科技》2024年第16期87-89,共3页Wireless Internet Science and Technology

摘　　要：当ATE机台进行集成电路测试时,系统会存在芯片的电参数测试条件超出ATE机台配置板卡资源的情况。因此,文章利用通用源表具备高性能测试指标的特点,设计基于ATE机台的通用源表程控系统。系统与ATE机台只须通过简单连接且无须编写复杂程控指令便可实现程控。系统可动态更改外接源表的功能配置与参数测试项顺序,辅助ATE机台完成连续自动测试。源表采集的测试数据可直接回传至ATE机台测试数据UI界面进行参数卡限判断。经实验验证,通用源表程控系统使得基于ATE的程控外接源表搭建更加简洁,测试操作更加便捷,芯片测试效率显著提升。When testing integrated circuits on ATE machines,the test conditions of the chip’s electrical parameters will exceed the board resources of ATE machines.Therefore,the program control system based on ATE machine is designed by using the characteristics of universal source table with high performance test index.The system and ATE machine can be programmed through simple connection and without writing complex program control instructions.The system can dynamically change the function configuration of the external source table and the sequence of parameter test items to assist the ATE machine to complete continuous automatic test.The test data collected by the source table can be directly sent back to the test data UI interface of the ATE machine for parameter card limit judgment.The experiment proves that the universal source table program control system makes the ATE based program control external source table more concise,test operation more convenient,and significantly improves the chip test efficiency.

关 键 词：ATE测试 源表程控 参数测试 系统设计 

分 类 号：TP23[自动化与计算机技术—检测技术与自动化装置]