基于同轴数字全息成像的颗粒测量与分类装置  

Particle Characterization and Classification Device Based on Digital in-Line Holography

作　　者：张文暄 张金莹 李璟文 Zhang Wenxuan;Zhang Jinying;Li Jingwen(School of Science,Jiangnan University,Wuxi 214122,Jiangsu,China)

机构地区：[1]江南大学理学院,江苏无锡214122

出　　处：《激光与光电子学进展》2024年第14期81-89,共9页Laser & Optoelectronics Progress

摘　　要：针对环境科学和诸多工业领域对气溶胶颗粒物实时检测和识别的应用需求,提出并开发了一种基于惯性冲击采样和同轴数字全息成像技术的颗粒分析检测平台,实现颗粒密度和折射率的同步测量,从而提高其分类精度。首先,通过惯性冲击器采样颗粒,并根据其惯性进行分离。随后,通过数字全息成像技术对颗粒的大小和位置进行分析,获取颗粒的密度。此外,采用Lorenz-Mie理论对颗粒的衍射图案进行拟合,提取颗粒折射率。实验证明,在颗粒密度或折射率相近且难以区分的情况下,引入另一个独立的指纹信息的测量,可以显著提高颗粒的分类和识别精度。In order to address requirements in the realms of environmental science and diverse industries for the detection and identification of aerosol particles,a particle analysis platform is devised.This platform leverages inertial impact sampling in conjunction with digital holographic imaging technology,which enables simultaneous measurement of both particle density and refractive index,thereby fostering a marked improvement in classification accuracy.The operational workflow commences with the sampling and segregation of particles via an inertial impactor,followed by analysis with digital holographic imaging technology,yielding crucial insights into their mass density.Additionally,by fitting diffraction patterns of particles to the LorenzMie theory,refractive index of individual particle is extracted.Empirical validation of our approach underscores its efficacy,particularly in scenarios characterized by closely matched particle density or refractive index.The introduction of an additional,independent fingerprint measurement emerges as a pivotal enhancement,yielding a substantive boost in both particle classification and identification accuracy.

关 键 词：数字全息 颗粒检测 MIE理论 计量学 

分 类 号：TB96[机械工程—光学工程]