精准温度控制半导体激光治疗仪及其可靠性分析  

Precise Temperature Control Semiconductor Laser Therapy Instrument and Its Reliability Analysis

作　　者：戴丽[1] 张旺 温易宸 赵俊 DAI Li;ZHANG Wang;WEN Yichen;ZHAO Jun(Department of Cariol&Endodont,Nanjing Stomatological Hospital,Medical School of Nanjing University,Nanjing Jiangsu 210008,China;National&Local Joint Engineering Research Center for Optical Sensing/Communications Integrated Networking,Southeast University,Nanjing Jiangsu 210096,China;Faculty of Electronic Information Engineering,Huaiyin Institute of Technology,Huaian Jiangsu 223003,China;Nanjing Xiguang Research Institute for Information Technology,Nanjing Jiangsu 210012,China)

机构地区：[1]南京大学医学院附属口腔医院牙体牙髓病科,江苏南京210008 [2]东南大学光传感/通信综合网络国家地方联合工程研究中心,江苏南京210096 [3]淮阴工学院电子信息工程学院,江苏淮安223003 [4]南京曦光信息科技研究院,江苏南京210012

出　　处：《中国医疗设备》2024年第9期28-34,共7页China Medical Devices

基　　金：南京市医学科技发展资金资助项目(GBX22304);南京大学医学院附属口腔医院3456骨干人才资助项目(0222N403;0222N409)。

摘　　要：目的探究影响基于保偏光纤温度传感器的半导体激光治疗仪功率稳定输出的关键因素,探索实用化的激光治疗系统光电子器件可靠性分析方法。方法基于可靠性框图法,对系统光电子器件及其外围电路建立可靠度(RSL)、失效率(λSL)和平均寿命(LSL)分析模型,分析使用环境、运行时间(t)和工作温度(T)对系统运行可靠性的影响。基于加速寿命模型分别在室温大驱动电流(T=25℃、I=2.5 A)、高温工作电流(T=50℃、I=1.5 A)和高温大驱动电流(T=50℃、I=2.5 A)条件下,测试LSL与T、I以及T和I相互作用条件下的关系。结果仿真结果表明,λSL随T的增加而增加,LSL随T的增加而降低,RSL随T和t的增加而降低,在I为1.5 A、T为50℃的条件下,λSL、LSL、RSL估计值分别为5.229×10-51/h、17824.500 h、0.11418。实验结果显示,LSL分别为22873、17693和4780 h,实验测试结果与仿真结果吻合。结论基于本研究所提方法,可结合系统架构、设计方法、使用环境,分析计算出设备的λSL是否满足使用规范,进而预测出设备的RSL与LSL,为设计制造与临床使用提供数据支撑。Objective To explore the key factors affecting the stable power output of a semiconductor laser therapy instrument based on a polarization-maintaining fiber temperature sensor and to investigate practical reliability analysis methods for optoelectronic devices in laser therapy system.Methods Based on the reliability block diagram method,reliability(RSL),failure rate(λSL)and average life(LSL)analysis models were established for the optoelectronic devices and their peripheral circuits of the system.The impact of operating environment,operating time(t)and working temperature(T)on the reliability of the system were analyzed.Based on the accelerated life model,the relationships between LSL and T,I,and the interaction between T and I were tested under conditions of room temperature high current(T=25℃,I=2.5 A),high temperature operating current(T=50℃,I=1.5 A),and high temperature high current(T=50℃,I=2.5 A).Results The simulation results showed thatλSL increased with the increase of T,LSL decreased with the increase of T,RSL decreased with the increase of T and t.Under the condition of I=1.5 A and T=50℃,the estimated values ofλSL,LSL and RSL were 5.229×10-51/h,17824.500 h and 0.11418 respectively.The experimental results show that the LSL were 22873,17693 and 4780 h respectively,and the experimental test results were basically consistent with the simulation results.Conclusion Based on the method proposed in this study,by combining system architecture,design methods,and usage environment,it is possible to analyze and calculate whether theλSL of the equipment meets the usage standards,which can further predict the RSL and LSL of the equipment,providing data support for design,manufacturing,and clinical use.

关 键 词：半导体激光治疗仪 光纤温度传感器 可靠性框图 加速寿命实验 可靠性 

分 类 号：R197.39[医药卫生—卫生事业管理]