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作 者:Yuying WANG Jindong LI Hezhi SUN Xiang LI
机构地区:[1]Beijing Institute of Spacecraft System Engineering,China Academy of Space Technology,Bejing 100094,China [2]Institute of Remote Sensing Satellite,China Academy of Space Technology,Beijing 100094,China
出 处:《Frontiers of Information Technology & Electronic Engineering》2024年第8期1031-1056,共26页信息与电子工程前沿(英文版)
基 金:Project supported by the National Basic Research Program of China(No.613322);the Beijing Nova Program,China(No.Z211100002121078);the National Natural Science Foundation of China(No.52202506)。
摘 要:Mid-wavelength infrared(MWIR)detection and long-wavelength infrared(LWIR)detection constitute the key technologies for space-based Earth observation and astronomical detection.The advanced ability of infrared(IR)detection technology to penetrate the atmosphere and identify the camouflaged targets makes it excellent for space-based remote sensing.Thus,such detectors play an essential role in detecting and tracking low-temperature and far-distance moving targets.However,due to the diverse scenarios in which space-based IR detection systems are built,the key parameters of IR technologies are subject to unique demands.We review the developments and features of MWIR and LWIR detectors with a particular focus on their applications in space-based detection.We conduct a comprehensive analysis of key performance indicators for IR detection systems,including the ground sampling distance(GSD),operation range,and noise equivalent temperature difference(NETD)among others,and their interconnections with IR detector parameters.Additionally,the influences of pixel distance,focal plane array size,and operation temperature of space-based IR remote sensing are evaluated.The development requirements and technical challenges of MWIR and LWIR detection systems are also identified to achieve high-quality space-based observation platforms.
关 键 词:Infrared detection Space application Mid-and long-wavelength infrared detection Space-based Earth observation Remote sensing
分 类 号:TP73[自动化与计算机技术—检测技术与自动化装置] V45[自动化与计算机技术—控制科学与工程]
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