基于光子计数测量的GIS/GIL环氧绝缘材料表面微缺陷检测研究  

Research on surface microdefect detection of GIS/GIL epoxy insulation materials based on photon counting

作　　者：公多虎 范贤浩 詹仲强 李山 迪力亚尔·多力昆 李传扬 GONG Duohu;FAN Xianhao;ZHAN Zhongqiang;LI Shan;DILIYAER·Duolikun;LI Chuanyang(State Grid Xinjiang Electric Power Co.,Ltd.Electric Power Science Research Institute,Urumqi 830000,China;Department of Electrical Engineering,Tsinghua University,Beijing 100084,China)

机构地区：[1]国网新疆电力有限公司电力科学研究院,新疆乌鲁木齐830000 [2]清华大学电机系,北京100084

出　　处：《绝缘材料》2024年第9期125-130,共6页Insulating Materials

基　　金：国网新疆电力有限公司2023年科技项目(5230D K230006)。

摘　　要：为弥补传统方法对环氧基绝缘微缺陷探测精度的不足,本文基于不同缺陷影响下光子释放信息的计数分析提出了一种新的缺陷检测方法。通过制备具有划痕、表面毛刺及金属微粒缺陷的绝缘拉杆及盆式绝缘子样本,进而在交流电压激励下获得上述样本局放起始前的光子计数结果。结果表明:严重缺陷样本平均光子计数可高达无缺陷样本平均光子计数的12倍以上,且光子计数结果受缺陷种类、尺寸、位置及绝缘气体影响显著,其中平均光子计数与缺陷严重程度呈正相关。因此,光子计数可作为探测环氧基绝缘材料早期缺陷的潜在工具。To address the limitations of traditional methods in accurately detecting micro-defects in epoxy-based insulation,we proposed a novel defect detection method based on photon emission counting analysis under different defect influence.Insulation rod and insulation spacer samples with scratches,surface protrusions,and metal particles were prepared,and their photon counting before partial discharge inception was tested under AC voltage excitation.The results indicate that the average photon counting of samples with severe defects is 12 times higher than that of samples without defects.The photon counting results are significantly influenced by defect types,sizes,position,and insulation gas,and the average photo counting is positively correlated with the defect severity.Therefore,the photon counting can be as a promising tool for early detection of defects in epoxy-based insulation materials.

关 键 词：环氧基绝缘 盆式绝缘子 光子计数 局部放电 缺陷检测 

分 类 号：TM855[电气工程—高电压与绝缘技术]