一种片上高稳定性RC振荡器设计  

A design of on-chip high stability RC oscillator

作　　者：郭宇鹏 陈磊 GUO Yupeng;CHEN Lei(College of Electronical and Information Engineering,Shanghai University of Electric Power,Shanghai 200120,China)

机构地区：[1]上海电力大学电子信息与工程学院,上海200120

出　　处：《电子设计工程》2024年第19期16-21,26,共7页Electronic Design Engineering

摘　　要：基于片上系统对高稳定性时钟的需求,采用sk110 nm工艺设计了一款高稳定性RC振荡器。采用比较器失调电压消除结构、比较器延时测量电路以及斩波电流镜结构电路提高了RC振荡器的稳定性。使用Cadence Spectre工具进行仿真验证,结果表明在5 V电源电压、TT工艺角、27℃环境下,振荡器输出频率为119.4 kHz;在-40~125℃温度变化范围内,电源电压为5 V情况下,输出频率变化范围在±0.5%以内;在4.5~5.5 V电源电压变化范围内,温度为27℃情况下,输出频率变化范围在±0.25%以内,适合集成到片上系统中。Based on the requirement of high-stability clock in system-on-chip,a high-stability RC oscillator is designed using sk110 nm process.The stability of the RC oscillator is improved by adopting a comparator offset voltage elimination structure,a comparator delay measurement circuit and a chopping current mirror structure circuit.Using the Cadence Specter tool for simulation verification,the results show that the output frequency of the oscillator is 119.4 kHz under the environment of 5 V power supply voltage,TT process angle,and 27℃;in the temperature range of-40~125℃,the power supply voltage is 5 V,the output frequency variation range is within±0.5%;within the 4.5~5.5 V power supply voltage variation range,and the temperature is 27℃,the output frequency variation range is within±0.25%,suitable for integration into SOC.

关 键 词：RC振荡器 高稳定性 延时测量 失调电压 斩波电流镜 

分 类 号：TN432[电子电信—微电子学与固体电子学]