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作 者:黄瀚元 周源 赖建伟 HUANG Hanyuan;ZHOU Yuan;LAI Jianwei(School of Ordnance Engineering,Naval University of Engineering,Wuhan 430033)
出 处:《舰船电子工程》2024年第7期147-150,共4页Ship Electronic Engineering
摘 要:以某型水下发射动力装置密封结构中O型密封圈为研究对象,研究其性能退化规律,准确预测评估其使用寿命。对新品和已经使用老化11年的旧品分别开展恒定温度应力下的热氧老化试验,依据阿伦尼乌斯模型和试验数据建立了密封圈老化程度和时间的老化动力学方程,建立了环境温度和老化反应速率的关系。在使用环境温度为25℃的前提下,得到新品的使用寿命约为13.7 a,已使用老化11年的旧品的使用寿命约为3.0 a,旧品的实际使用寿命约为14.0 a。结果表明,试验数据与实际结果较为吻合,该密封圈的实际使用寿命在14 a左右,为装备的使用维护提供了参考依据。The article takes the O-ring in the sealing structure of a certain type of underwater launch power device as the research object,studies its performance degradation law,and accurately predicts and evaluates its service life.Thermal oxidative aging tests are conducted on new products and old products that have been aged for 11 years under constant temperature stress.Based on the Arrhenius model and experimental data,an aging kinetics equation for the degree and time of seal ring aging is established,and the relationship between environmental temperature and aging reaction rate is established.Under the premise of using an ambient temperature of 25℃,the service life of the new product is about 13.7 years,and the service life of the old product that has been aged for 11 years is about 3.0 years,the actual service life of the old product is about 14.0 years.The results indicate that the experimental data is in good agreement with the actual results,and the actual service life of the sealing ring is around 14 years,providing a reference basis for the use and maintenance of the equipment.
分 类 号:TJ762.4[兵器科学与技术—武器系统与运用工程]
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