Design of Control System for Afterglow Mode of Ion Source in HIRFL  

HIRFL离子源AG模式控制系统设计

作　　者：Wang Pengpeng Zhang Wei An Shi 王鹏鹏

机构地区：[1]不详

出　　处：《IMP & HIRFL Annual Report》2022年第1期317-317,共1页中国科学院近代物理研究所和兰州重离子研究装置年报（英文版）

摘　　要：As afterglow phenomenon in the ECR source,a spike will appear in the highly charged ion beam when the microwave pulse stops.The peak intensity of beam current can typically be several times higher than in CW mode,as shown in Fig.1.So the requirements for control system,is to capture the timing signal of the start of the accelerator cycle,and output a specific number,pulse width,delay time,and duty cycle which is adjustable trigger signal to the microwave system of ion source.

关 键 词：MICROWAVE beam CYCLE 

分 类 号：O57[理学—粒子物理与原子核物理]