材料亚表面/表面缺陷锁相红外热成像检测研究现状与趋势  

Research Status and Development Trend of Lock-in Infrared Thermography Detection of Material Subsurface/Surface Defects

作　　者：王慧鹏 蔡冬威 董丽虹 林恩 王海斗[2,4] WANG Huipeng;CAI Dongwei;DONG Lihong;LIN En;WANG Haidou(School of Mechanical and Electrical Engineering,Jiangxi University of Technology,Ganzhou 341000,Jiangxi,China;National Key Laboratory for Remanufaeturing,Army Academy of Armored Forces,Beijing 100072,China;School of Mechanical Engineering,Zhejiang University of Technology,Hangzhou 310023,China;National Engineering Research Center for Remanufacture of Mechanical Products,Army Academy of Armored Forces,Beijing 100072,China)

机构地区：[1]江西理工大学机电工程学院,江西赣州341000 [2]陆军装甲兵学院装备再制造技术国防科技重点实验室,北京100072 [3]浙江工业大学机械工程学院,杭州310023 [4]陆军装甲兵学院机械产品再制造国家工程研究中心,北京100072

出　　处：《材料导报》2024年第18期35-42,共8页Materials Reports

基　　金：国家自然科学基金(52175206,52130509);某类重点项目(ZD-302-12)。

摘　　要：材料亚表面/表面缺陷的有效检测是确保结构安全性和可靠性的重要保证。锁相红外热成像是主动红外热成像中的一个分支,因具有加热激励功率强度低、对不均匀加热和表面发射率变化不敏感等优点,被广泛用于材料亚表面分层、脱粘等缺陷检测。近年来随着研究的不断深入,锁相红外热成像在表面裂纹检测和深度量化上也提出了有效的表征方法。微小、深埋、不规则等缺陷检测以及非均质材料和复杂结构中的缺陷检测一直是热点和难点问题。国内外学者致力于提出新的缺陷表征方法,并减少噪声、横向热扩散等因素对缺陷检测的影响,提高缺陷定性检测和定量表征能力。本文从缺陷特征提取方法、检测影响因素等角度入手对国内外学者的研究进行总结,总结了锁相红外热成像在材料亚表面和表面缺陷检测的研究进展,并对锁相红外热成像的前景进行了展望。Effective detection of subsurface/surface defects of materials is an important guarantee to ensure the safety and reliability of structures.Lock-in infrared thermography is a branch of active infrared thermography.Because of its advantages of low heating excitation power intensity,insensitive to non-uniform heating and surface emissivity changes,it is widely used in defect detection such as subsurface delamination and debonding of materials.In recent years,with the deepening of research,lock-in infrared thermography has also proposed effective characterization methods for surface crack detection and depth quantification.Defect detection such as small,deep and irregular defects and defect detection in heterogeneous materials and complex structures have always been hot and difficult points in defect detection.Domestic and foreign scholars committed to proposing new defect characterization methods,reducing the influence of noise,transverse thermal diffusion and other factors on defect detection,and improving the ability of qualitative detection and quantitative characterization of defects.In this review,the research of domestic and foreign scholars is summarized from the perspectives of defect characterization extraction methods and detection of influencing factors,and the research of lock-in infrared thermography on the subsurface and surface defect detection of materials is summarized,and the prospect of lock-in infrared thermography is prospected.

关 键 词：锁相红外热成像 缺陷检测 亚表面缺陷 表面裂纹 

分 类 号：TG115.28[金属学及工艺—物理冶金]