Revealing the microstructures of metal halide perovskite thin films via advancedtransmission electron microscopy  

作　　者：Yeming Xian Xiaoming Wang Yanfa Yan 冼业铭;王晓明;鄢炎发(Department of Physics and Astronomy and Wright Center for Photovoltaics Innovation and Commercialization,The University of Toledo,Toledo,Ohio 43606,United States)

机构地区：[1]Department of Physics and Astronomy and Wright Center for Photovoltaics Innovation and Commercialization,The University of Toledo,Toledo,Ohio 43606,United States

出　　处：《Chinese Physics B》2024年第9期30-41,共12页中国物理B（英文版）

摘　　要：Metal halide perovskites (MHPs) are excellent semiconductors that have led to breakthroughs in applications in thinfilmsolar cells, detectors, and light-emitting diodes due to their remarkable optoelectronic properties and defect tolerance.However, the performance and stability of MHP-based devices are significantly influenced by their microstructures includingthe formation of defects, composition fluctuations, structural inhomogeneity, etc. Transmission electron microscopy(TEM) is a powerful tool for direct observation of microstructure at the atomic-scale resolution and has been used to correlatethe microstructure and performance of MHP-based devices. In this review, we highlight the application of TEMtechniques in revealing the microstructures of MHP thin films at the atomic scale. The results provide critical understandingof the performance of MHP devices and guide the design of strategies for improving the performance and stability ofMHP devices.

关 键 词：PEROVSKITE DEFECT INHOMOGENEITY transmission electron microscopy 

分 类 号：TB383.2[一般工业技术—材料科学与工程] TN16[电子电信—物理电子学]