Visualizing extended defects at the atomic level in a Bi_(2)Sr_(2)CaCu_(2)O8_(+σ) superconducting wire  

作　　者：Kejun Hu Shuai Wang Boyu Li Ying Liu Binghui Ge Dongsheng Song 胡柯钧;王帅;李泊玉;刘影;葛炳辉;宋东升(Information Materials and Intelligent Sensing Laboratory of Anhui Province,Key Laboratory of Structure and Functional Regulation of Hybrid Materials of Ministry of Education,Institutes of Physical Science and Information Technology,Anhui University,Hefei 230601,China)

机构地区：[1]Information Materials and Intelligent Sensing Laboratory of Anhui Province,Key Laboratory of Structure and Functional Regulation of Hybrid Materials of Ministry of Education,Institutes of Physical Science and Information Technology,Anhui University,Hefei 230601,China

出　　处：《Chinese Physics B》2024年第9期43-47,共5页中国物理B（英文版）

摘　　要：The microstructure significantly influences the superconducting properties.Herein,the defect structures and atomic arrangements in high-temperature Bi_(2)Sr_(2)CaCu_(2)O8_(+σ) superconducting wire are directly characterized via stateof-the-art scanning transmission electron microscopy.Interstitial oxygen atoms are observed in both the charge reservoir layers and grain boundaries in the doped superconductor.Inclusion phases with varied numbers of CuO_(2) layers are found,and twist interfaces with different angles are identified.This study provides insights into the structures of Bi-2212 wire and lays the groundwork for guiding the design of microstructures and optimizing the production methods to enhance superconducting performance.

关 键 词：SUPERCONDUCTOR microstructure DEFECT scanning transmission electron microscopy 

分 类 号：O511.3[一般工业技术—材料科学与工程]