X射线衍射技术中噪声波动对微量物相鉴定的影响  

Effect of noise fluctuation on trace phase identification in X-ray diffraction technique

作　　者：陈河 王春建[1,2] 徐家坤 肖寒[1] 李敬民 CHEN He;WANG Chunjian;XU Jiakun;XIAO Han;LI Jingmin(School of Materials Science and Engineering,Kunming University of Science and Technology,Kunming 650093,China;Analysis and Testing Research Center,Kunming University of Science and Technology,Kunming 650093,China;Yunnan Ledford Technology Corperation Limited,Kunming 650093,China)

机构地区：[1]昆明理工大学材料科学与工程学院,云南昆明650093 [2]昆明理工大学分析测试研究中心,云南昆明650093 [3]莱德福科技有限公司,云南昆明650093

出　　处：《冶金分析》2024年第9期14-19,共6页Metallurgical Analysis

基　　金：云南省重大科技专项计划(202202AB080016)。

摘　　要：论文重点研究了X射线衍射(XRD)技术背景噪声在微量物相鉴定过程中的影响。结果表明:背景噪声可划分为噪声大小和噪声波动两部分,噪声波动可进一步细分为波峰、波谷、平台3种类型;利用噪声波动的比对情况,依然可以对微量物相开展3强线、5强线等比对分析,并确认微量物相组成。在此基础上,论文对微量CaCO_(3)物相提供的微弱衍射信号开展了定性表征,发现除了CaCO_(3)物相卡片(PDF#00-047-1743)中的3强线、5强线、甚至8强线均可与背景噪声中的波峰或平台类型一一比对外,其他物相卡片的较强衍射线均无法达到“都与波峰或平台一一比对”的情况,这一结果较好地验证了背景噪声在物相鉴定分析中的作用。The influence of background noise on trace phase identification in X-ray diffraction(XRD)was focused in this study.The results showed that background noise could be divided into two parts:noise amplitude and noise fluctuation.The noise fluctuation could be further classified into three types:peaks,valleys,and platforms.According to the comparison of noise fluctuation,it was still possible to carry out match analysis using 3 strongest lines,5 strongest lines,and so on of trace phase cards and confirm trace phase composition.On the basis of this,weak diffraction signals provided by trace CaCO_(3) phase was qualitatively characterized.It was found that 3 strongest lines,5 strongest lines,even 8 strongest lines in CaCO_(3) phase card(PDF#00-047-1743)were one-to-one matched with peaks or platforms of background noise,and the notable diffraction lines in other phase cards could not meet“one-to-one matched with the peaks or platforms”.The results well verified the role of background noise in trace phase identification and analysis.

关 键 词：X射线衍射(XRD) 背景噪声 噪声波动 信噪比 定性分析 物相鉴定 

分 类 号：O722[理学—晶体学]