计算芯片(MCU)测试台架方案设计与试验验证  

Design and Verification of Computing Chip(MCU)Test Bench

作　　者：刘廷娇 葛俊良 陈磊 邵旭东 沙暄晨 梁艳艳 LIU Tingjiao;GE Junliang;CHEN Lei;SHAO Xudong;SHA Xuanchen;LIANG Yanyan

机构地区：[1]上汽通用五菱汽车股份有限公司

出　　处：《计量与测试技术》2024年第9期65-67,共3页Metrology & Measurement Technique

摘　　要：目的:为了解决计算芯片(MCU)应用前期,需针对每一款分别设计对应的开发板、进行外设的功能驱动测试、不具备通用性、制作PCB板周期长等问题。方法:设计一种标准模块化测试台架,并对通讯和外设进行实验验证。结论:该台架整体功满足设计要求,适应于所有相同封装的MCU,可为其测试提供一种可行方案。Objective:In order to solve the early application stage of computing chip(MCU),it is necessary to de-sign corresponding development board for each,carry out functional driving test of peripheral devices,lack of univer-sality,and long production cycle of PCB board.Methods:A standard modular test bench was designed and the com-munication and peripherals were verified by experiments.Conclusion:The whole function of the frame meets the de-sign requirements and is suitable for all MCUS with the same package,which can provide a feasible scheme for its testing.

关 键 词：国产替代 计算芯片(MCU) 最小系统板 功能底板 

分 类 号：TN40[电子电信—微电子学与固体电子学]