检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
作 者:Yehua Tang Yuchao Wang Chunlan Zhou Ke-Fan Wang
机构地区:[1]Electrical and Energy Engineering Department,Nantong Institute of Technology,Nantong 226000,China [2]Ningxia Research Center of Silicon Target and Silicon-Carbon Negative Materials Engineering Technology,School of Materials Science and Engineering,North Minzu University,Yinchuan 750021,China [3]Institute of Electrical Engineering,Chinese Academy of Sciences,Beijing 100049,China [4]School of Engineering Science,University of Chinese Academy of Sciences,Beijing 100049,China [5]Henan Key Laboratory of Quantum Materials and Quantum Energy,School of Future Technology,Henan University,Kaifeng 475004,China
出 处:《Journal of Semiconductors》2024年第10期60-68,共9页半导体学报(英文版)
基 金:support given by the Natural Science Foundation of Nantong(Grant NO.JC2023065);the Research Program of Nantong Institute of Technology(Grant NO.2023XK(B)07).
摘 要:Here,p-type polysilicon films are fabricated by ex-situ doping method with ammonium tetraborate tetrahydrate(ATT)as the boron source,named ATT-pPoly.The effects of ATT on the properties of polysilicon films are comprehensively analyzed.The Raman spectra reveal that the ATT-pPoly film is composed of grain boundary and crystalline regions.The preferred orientation is the(111)direction.The grain size increases from 16−23 nm to 21−47 nm,by~70%on average.Comparing with other reported films,Hall measurements reveal that the ATT-pPoly film has a higher carrier concentration(>10^(20)cm^(−3))and higher carrier mobility(>30 cm2/(V·s)).The superior properties of the ATT-pPoly film are attributed to the heavy doping and improved grain size.Heavy doping property is proved by the mean sheet resistance(Rsheet,m)and distribution profile.The R_(sheet,m)decreases by more than 30%,and it can be further decreased by 90%if the annealing temperature or duration is increased.The boron concentration of ATT-pPoly film annealed at 950℃ for 45 min is~3×10^(20)cm^(−3),and the distribution is nearly the same,except near the surface.Besides,the standard deviation coefficient(σ)of Rsheet,m is less than 5.0%,which verifies the excellent uniformity of ATT-pPoly film.
关 键 词:polysilicon film boron doping ammonium tetraborate tetrahydrate(ATT) electrical properties CRYSTALLIZATION
分 类 号:TN304.12[电子电信—物理电子学]
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:18.117.157.139