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作 者:宇文晓彤 黄以锋 潘晋新 王生龙 焦晓璇 Yuwen Xiaotong;Huang Yifeng;Pan Jinxin;Wang Shenglong;Jiao Xiaoxuan(Aviation Engineering School,Air Force Engineering University,Xi′an 710038,China)
出 处:《电子测量与仪器学报》2024年第7期159-166,共8页Journal of Electronic Measurement and Instrumentation
摘 要:在实际服役环境中,飞机发生的总故障的40%是由于密封泄漏造成的,其密封性能的优劣直接影响产品的功能、性能和使用可靠性。然而,飞机上缺乏对密封圈的磨损监测,导致密封圈健康状态难以评估。针对这一问题,本研究提出了一种基于物理模型与统计分析的活动密封O形圈磨损预测方法,首先对密封圈的磨损进行了机理分析和参数测定;其次,采用Abaqus有限元软件模拟研究了密封圈的运动过程,得到密封圈的接触应力;然后,对舵机每个架次的累计行程进行统计分析,得到行程的概率统计曲线,结合Holm-Archard磨损模型得到磨损体积的概率分布曲线;最后,结合时间与行程的关系,建立了磨损体积与时间之间的数学模型。采用多个样本进行验证,结果表明,实际磨损体积在预测密度函数的3σ范围内的概率为95.83%,证明本研究建立的模型能够有较大概率预测活动密封的O形圈的体积磨损情况。In actual service environments,40%of the total failures that occur in aircraft are caused by sealing leaks,and the quality of their sealing performance directly affects the functionality,performance,and reliability of the product.However,the lack of wear monitoring of sealing rings on aircraft makes it difficult to evaluate the health status of sealing rings.To address this issue,this paper proposes a method for predicting the wear of active O-sealing based on physical model and statistical analysis.Firstly,a mechanism analysis and parameter measurement are conducted on the wear of the sealing ring.Secondly,Abaqus finite element software is used to simulate and study the motion process of the sealing ring,obtaining the contact stress of the sealing ring.Then,statistical analysis is conducted on the cumulative stroke of each servo flight to obtain the probability statistical curve of the stroke.Combined with the Holm Archard wear model,the probability distribution curve of the wear volume is obtained.Finally,based on the relationship between time and travel,a mathematical model between wear volume and time is established.Multiple samples are used for validation,and the results show that the probability of the actual wear volume within the predicted density function’s 3σrange is 95.83%,proving that the model in this paper has a high probability of predicting the volume wear of the O-sealing for active seals.
关 键 词:O形密封圈 磨损预测 有限元分析 统计分析 Holm-Archard模型
分 类 号:TN04[电子电信—物理电子学]
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