GJB 548《微电子器件试验方法和程序》发展历程概览  

Overview of the Development History of GJB 548“Test Methods and Procedures for Microelectronics”

作　　者：安琪 AN Qi(China Electronics Standardization Institute,Beijing 100176,China)

机构地区：[1]中国电子技术标准化研究院,北京100176

出　　处：《电子产品可靠性与环境试验》2024年第5期104-107,共4页Electronic Product Reliability and Environmental Testing

摘　　要：阐述了GJB 548《微电子器件试验方法和程序》的作用和地位,简要回顾了该标准的各阶段发展历程,展现了电子元器件标准化工作经历从无到有的起步时期、阶梯性拔高的过渡时期、对标国外先进水平的追赶时期和强化自主研究与改进的创新时期,通过重点标准的发展演进反映了我国电子元器件产业40余年来的巨大进步,也体现了作为国防领域根基构成部分的关键性基础标准与我国电子元器件产品可靠性发展的密切关系。The function and status of GJB 548“Test methods and procedures for microelectronics”are described.The development of the standard in each stage is briefly reviewed,and it shows that the standardization work of electronic components has gone through a starting period from scratch,a transitional period of step-by-step upgrading,a period of catching up with advanced foreign levels,and an innovative period of strengthening independent research and improvement.Through the development and evolution of key standards,it reflects the great progress of China’s electronic components industry over the past 40 years,and also reflects the close relationship between the key basic standards as a fundamental part of the national defense field and the reliability development of China’s electronic components products.

关 键 词：GJB 548 发展历程 电子元器件 可靠性 

分 类 号：T-652.1[一般工业技术] TN601[电子电信—电路与系统]