T/R组件过激励试验可靠性与失效机理研究  

Study on Reliability and Failure Mechanism of Over Excitation Test for T/R Module

作　　者：王振亚[1] 刘文豹[1] WANG Zhen-ya;LIU Wen-bao(The 13th Research Institute,CETC,Shijiazhuang 050051)

机构地区：[1]中国电子科技集团公司第十三研究所,石家庄050051

出　　处：《环境技术》2024年第9期68-72,共5页Environmental Technology

摘　　要：T/R组件作为通信系统的核心部件,在运行环境下其接收通道经常面临外界大功率强扰动信号。外界大功率强扰动信号是影响T/R组件可靠性的重要因素,鉴于此本文搭建T/R组件过激励测试试验平台,对T/R组件接收通道进行过激励试验,并借助金相显微镜及聚焦离子束等失效分析技术对试验后T/R组件开展失效分析研究。依据试验结果,确定了组件中接收通道在过激励下的失效部位、失效模式及失效机理,检验了典型T/R组件的抗扰动、耐功率、抗烧毁能力,为T/R组件的耐功率、抗烧毁设计提供借鉴和指导。T/R module are the core components of communication systems,and the receiver channel in the T/R module often face strong interference signals from the outside environment in operation.Strong external interference signals are an important factor affecting the reliability of T/R module.Therefore,this paper establishes a test platform for over-excitation testing of T/R module and conducts over-excitation tests on T/R module.It also uses metallographic microscopes and focused ion beam(FIB)failure analysis techniques to conduct failure analysis on the T/R module after the test.Based on the test results,the failure locations,failure modes,and failure mechanisms of the receiver channel in the T/R module under over-excitation are determined.The test verifies the antiinterference,power resistance,and burnout resistance of typical T/R module,and provides reference and guidance for the power resistance and burnout resistance design of T/R module.

关 键 词：T/R组件 过激励试验 可靠性 失效分析 

分 类 号：TN957[电子电信—信号与信息处理]