g-C_(3)N_(4)/TiO_(2-X) heterojunction with high-efficiency carrier separation and multiple charge transfer paths for ultrasensitive SERS sensing  

在线阅读下载全文

作  者:Xin Jiang Han Jiang Yimin Tang Huizhu Zhang Libin Yang Xiuwen Wang Bing Zhao 

机构地区:[1]College of Chemistry and Chemical Engineering,Technology Innovation Center of Industrial Hemp for State Market Regulation,Qiqihar University,Qiqihar 161006,China [2]College of Pharmacy,Jjiamusi University,Jjiamusi 154007,China [3]State Key Laboratory of Supramolecular Structure and Materials,Jilin University,Changchun 130012,China

出  处:《Chinese Chemical Letters》2024年第10期524-529,共6页中国化学快报(英文版)

基  金:supported by National Natural Science Foundation of China(Nos.21804054,21773080);Natural Science Foundation of Heilongjiang Province of China for Distinguished Young Scholars(No.JQ2019B002);Scientific Research Project of Qiqihar University(Nos.130412223001,130412223002)。

摘  要:The combination of interface engineering and defect engineering is a promising strategy for developing new semiconducting surface-enhanced Raman scattering(SERS)substrate.Herein,an organic/inorganic hybrid g-C_(3)N_(4)/TiO_(2-X)heterojunction with synchronous generation of strong interface effect and abundan surface oxygen vacancy(OV)defect was prepared by a simple sol-hydrothermal procedure with a help of urea.Due to the improved substrate-to-molecule charge transfer(CT)from joint contribution of high efficiency carrier separation induced by strong interface coupling effect and multiple CT paths derived from abundant surface OV,g-C_(3)N_(4)/TiO_(2-X)substrate exhibits greatly enhanced SERS effect for non-resonan4-mercaptobenzoic acid(4-MBA)probe.The enhancement factor of g-C_(3)N_(4)/TiO_(2-X)substrate for 4-MBA i as high as 5.57×10^(6),and the substrate exhibits ultra-high stability and excellent spectral reproducibility More meaningfully,the developed g-C_(3)N_(4)/TiO_(2-X)heterojunction can be used to execute an ultrasensitive detection for antibiotic residues in real water system,even comprehensive evaluation of multi-componen residues.

关 键 词:SERS SEMICONDUCTOR HETEROJUNCTION Surfacedefect Detection 

分 类 号:TB34[一般工业技术—材料科学与工程] O657.37[理学—分析化学]

 

参考文献:

正在载入数据...

 

二级参考文献:

正在载入数据...

 

耦合文献:

正在载入数据...

 

引证文献:

正在载入数据...

 

二级引证文献:

正在载入数据...

 

同被引文献:

正在载入数据...

 

相关期刊文献:

正在载入数据...

相关的主题
相关的作者对象
相关的机构对象