Bottom-up construction of low-dimensional perovskite thick films for high-performance X-ray detection and imaging  

作　　者：Siyin Dong Zhenghui Fan Wei Wei Shujie Tie Ruihan Yuan Bin Zhou Ning Yang Xiaojia Zheng Liang Shen 

机构地区：[1]Sichuan Research Center of New Materials,Institute of Chemical Materials,China Academy of Engineering Physics,Shuangliu,Chengdu,China [2]State Key Laboratory of Integrated Optoelectronics,College of Electronic Science and Engineering,International Center of Future Science,Jilin University,Changchun,China

出　　处：《Light(Science & Applications)》2024年第9期1809-1819,共11页光（科学与应用)（英文版）

基　　金：supported by the National Natural Science Foundation of China(grant Nos.NSFC62004182,62305128);the Sichuan Science and Technology Program(grant no.2022JDRC0021);the Career Development Grant of Institute of Chemical Materials(STB-2021-10),the International Cooperation and Exchange Project of Jilin Province(20210402079GH,20230402056GH);the 19th batch of innovative and entrepreneurial talent projects in Jilin Province(2023QN01);the Project of Science and Technology Development Plan of Jilin Province(Grant No.20220508037RC).

摘　　要：Quasi-two-dimensional(Q-2D)perovskite exhibits exceptional photoelectric properties and demonstrates reduced ion migration compared to 3D perovskite,making it a promising material for the fabrication of highly sensitive and stable X-ray detectors.However,achieving high-quality perovskite films with sufficient thickness for efficient X-ray absorption remains challenging.Herein,we present a novel approach to regulate the growth of Q-2D perovskite crystals in a mixed atmosphere comprising methylamine(CH3NH2,MA)and ammonia(NH3),resulting in the successful fabrication of high-quality films with a thickness of hundreds of micrometers.Subsequently,we build a heterojunction X-ray detector by incorporating the perovskite layer with titanium dioxide(TiO2).The precise regulation of perovskite crystal growth and the meticulous design of the device structure synergistically enhance the resistivity and carrier transport properties of the X-ray detector,resulting in an ultrahigh sensitivity(29721.4μC Gyair−1 cm−2)for low-dimensional perovskite X-ray detectors and a low detection limit of 20.9 nGyair s−1.We have further demonstrated a flat panel X-ray imager(FPXI)showing a high spatial resolution of 3.6 lpmm−1 and outstanding X-ray imaging capability under low X-ray doses.This work presents an effective methodology for achieving high-performance Q-2D perovskite FPXIs that holds great promise for various applications in imaging technology.

关 键 词：PEROVSKITE DIMENSIONAL performance 

分 类 号：O434.1[机械工程—光学工程]