基于低频噪声测量技术的电子元器件测试方法  

Testing Method for Electronic Components Based on Low Frequency Noise Measurement Technology

作　　者：曹祥林 CAO Xianglin(Guangdong University of Petrochemical Technology,Maoming 525000,China)

机构地区：[1]广东石油化工学院,广东茂名525000

出　　处：《电声技术》2024年第9期152-154,共3页Audio Engineering

摘　　要：针对电子元器件低频噪声测试的复杂性和传统方法的局限性,提出基于低频噪声测量技术的电子元器件测试方法。该方法通过同步检波技术提取噪声信号,再经自适应滤波算法降噪,获得纯净的低频噪声。实验结果表明,该方法能够有效捕捉金氧半场效晶体管(Metal-Oxide-Semiconductor Field-Effect Transistor,MOSFET)低频噪声随栅极电压的变化特性,为深入研究MOSFET低频噪声的温度效应提供了可靠工具。Aiming at the complexity of low frequency noise testing for electronic components and the limitations of traditional methods,a testing method for electronic components based on low frequency noise measurement technology is proposed.This method extracts noise signals through synchronous detection technology,and then applies adaptive filtering algorithms to reduce noise,obtaining pure low frequency noise.The experimental results show that this method can effectively capture the variation characteristics of Metal-Oxide-Semiconductor Field-Effect Transistor(MOSFET)low frequency noise with gate voltage,providing a reliable tool for further studying the temperature effect of MOSFET low-frequency noise.

关 键 词：低频噪声 电子元器件 同步检波 

分 类 号：TN606[电子电信—电路与系统]