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作 者:郎金鹏 葛崇琳 韩纪磊 黄琳 盛立文 LANG Jinpeng;GE Chonglin;HAN Jilei;HUANG Lin;SHENG Liwen(Ceyear Technologies Co.,Ltd,Qingdao,Shandong 266555,China;Shandong Electronic Test&Measurement Technology Innovation Center,Qingdao,Shandong 266555,China;Science and Technology on Electronic Test&Measurement Laboratory,Qingdao,Shandong 266555,China;School of Information Science and Engineering,Shandong University,Qingdao,Shandong 266237,China)
机构地区:[1]中电科思仪科技股份有限公司,山东青岛266555 [2]山东省电子测量仪器技术创新中心,山东青岛266555 [3]电子测试技术重点实验室,山东青岛266555 [4]山东大学信息科学与工程学院,山东青岛266237
出 处:《河北工业大学学报》2024年第5期34-38,共5页Journal of Hebei University of Technology
基 金:国家自然科学基金资助项目(U23B2046);国家重点研发计划资助项目(2022YFF0705900,2022YFF0707102)。
摘 要:半导体激光光源在激光雷达、空间探测以及光纤智能感知等领域有着重要作用,其中可调谐半导体激光光源还可用于新一代可重构光分插复用系统中光器件等的波长相关和偏振依赖损耗测试。基于Litt-man结构的外腔反馈型可调谐半导体激光光源是一种实现宽调谐、高光谱纯净度和无跳模谐振输出的有效手段。笔者团队利用联合研制的中心波长为1526.276 nm、3 dB带宽为111.0054 nm的增益芯片作为内腔种子源,通过闪耀光栅将不同波长锁定在振荡器中,实现了最快扫描速度为200 nm/s、最小触发间隔为5 pm、本征线宽小于10.02 kHz及无跳模范围为130 nm的单纵模扫频输出。结果表明,凭借InGaAsP/InP增益芯片优异的宽光谱光学特性和Littman反馈原理,本研究结果有助于推动波长快速扫描测试系统的研究进程,提升相关器件测试的精度和效率。The semiconductor laser source is critical in Lidar,space detection,and optical fiber intelligent perception.Particularly,tunable semiconductor laser sources are essential for measuring wavelength/polarization-dependent loss in optical devices within the next-generation reconfigurable optical division multiplexing systems.An external cavity feedback tunable semiconductor laser based on the Littman configuration offers a solution for achieving broad tuning ranges,high spectral purity,and mode-hop-free lasing output.A gain chip with a central wavelength of 1526.276 nm and a 3 dB bandwidth of 111.0054 nm shows significant potential as an internal cavity seed source,with different wavelengths stabilized in the oscillator via a blazed grating.Additionally,a maximum sweep speed of 200 nm/s,a minimum trigger interval of 5 pm,an intrinsic linewidth of less than 10.02 kHz,and a single longitudinal mode sweep frequency output of 130 nm without mode-hopping are demonstrated.These results highlight the excellent wide-spectrum optical properties of the InGaAsP/InP gain chip and the effectiveness of the Littman feedback principle.This study advances the development of fast wavelength scanning test systems and enhances the accuracy and efficiency of device testing.
分 类 号:TN321[电子电信—物理电子学] TN248.4
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