Exceptional point enhanced nanoparticle detection in deformed Reuleaux‑triangle microcavity  

作　　者：Jinhao Fei Xiaobei Zhang Qi Zhang Yong Yang Zijie Wang Chuanlu Deng Yi Huang Tingyun Wang 

机构地区：[1]Key Laboratory of Specialty Fiber Optics and Optical Access Networks,Joint International Research Laboratory of Specialty Fiber Optics and Advanced Communication,Shanghai Institute for Advanced Communication and Data Science,School of Communication and Information Engineering,Shanghai University,Shanghai 200444,China

出　　处：《Frontiers of Optoelectronics》2024年第3期83-91,共9页光电子前沿（英文版）

基　　金：This work was supported in part by the National Natural Science Foundation of China(NSFC)(Grant Nos.62022053 and 62205192);in part by the Science and Technology Commission of Shanghai Municipality Project(22010500100,22ZR1424800);in part by the Open Project Program of Wuhan National Laboratory for Optoelectronics(2021WNLOKF002);and in part by the 111 Project(D20031).

摘　　要：In this paper,we propose a deformed Reuleaux-triangle resonator(RTR)to form exceptional point(EP)which results in the detection sensitivity enhancement of nanoparticle.After introducing single nanoparticle to the deformed RTR at EP,frequency splitting obtains an enhancement of more than 6 times compared with non-deformed RTR.In addition,EP induced a result that the far feld pattern of chiral mode responses signifcantly to external perturbation,corresponding to the change in internal chirality.Therefore,single nanoparticle with far distance of more than 4000 nm can be detected by measuring the variation of far feld directional emission.Compared to traditional frequency splitting,the far feld pattern produced in deformed RTR provides a cost-efective and convenient path to detect single nanoparticle at a long distance,without using tunable laser and external coupler.Our structure indicates great potential in high sensitivity sensor and label-free detector.

关 键 词：Exceptional point Deformed microcavity Nanoparticle detection Far-feld pattern 

分 类 号：O439[机械工程—光学工程]