工艺温漂对高精度电路的影响及其解决办法  

The influence of Process Temperature Drift On High-Precision Circuits and the Solutions

作　　者：薛晨 康海容 XUE Chen;KANG Hai-rong(Shenzhen State Micro Electronics Co.,Ltd)

机构地区：[1]深圳市国微电子有限公司

出　　处：《中国集成电路》2024年第10期83-86,共4页China lntegrated Circuit

摘　　要：对于高精度电路而言,工艺稳定性对其电性能影响越来越重要,电阻电容器件的温漂对芯片电气性能影响的主要表现是测试参数在高低温下的恶化和超标。高精度电路的设计具有温漂小、精度高的特点,因此对于高精度器件来说,工艺器件温漂对其的影响是不得不考虑的一个因素。本文针对一款高精度时钟电路进行测试和分析,通过对工艺器件的温漂分析,提高时钟电路的性能。For high-precision circuits,process stability is becoming more and more significant for their electrical performance.The main impact of temperature drift of resistors and capacitors on chip electrical performance is the degradation and exceeding of test parameters at high and low temperatures.The design of high-precision circuits is characterized by low temperature drift and high accuracy.Therefore,for high-precision components,the impact of process component temperature drift is a factor that cannot be ignored.This article tests and analyzes a high-precision clock,aiming to improve clock performance through analysis of temperature drift in process components.

关 键 词：高精度 低温漂 修调 

分 类 号：TN405[电子电信—微电子学与固体电子学]